High thermal stability of high-power phosphor based white-light-emitting diodes employing Ce:YAG-doped glass

Proceedings - Electronic Components and Technology Conference

Volumn , Issue , 2010, Pages 700-703

  Tsai, Chun Chin ^a   Chung, Cheng Hsun ^a   Wang, Jimmy ^a   Cheng, Wei Chih ^a   Chen, Ming Hung ^a   Liou, Jyun Sian ^a   Chang, Jin Kai ^b,c   Hsu, Yi Cheng ^b,c   Hung, Shang Chao ^c,d   Lee, Chao Wei ^c,e   Hu, Hung Lieh ^c,e   Huang, Sheng Bang ^c,e   Kuang, Jao Hwa ^a   Cheng, Wood Hi ^a  

^a NATIONAL SUN YAT SEN UNIVERSITY   (Taiwan)

^b NATIONAL PINGTUNG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Taiwan)

^c National Pingtung University of Science and Technology ^*  (Taiwan)

^d Shin Chien University   (Taiwan)

^e INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

DOPED GLASS; HIGH RELIABILITY; HIGH THERMAL STABILITY; HIGH-POWER; PHOSPHOR LAYERS; THERMAL STABILITY; WHITE LIGHT EMITTING DIODES; YAG;

CERIUM COMPOUNDS; GLASS; LIGHT EMISSION; LIGHT EMITTING DIODES; PHOSPHORS; SILICONES; THERMAL AGING; THERMODYNAMIC STABILITY;

CERIUM;

EID: 77955194836     PISSN: 05695503     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ECTC.2010.5490776     Document Type: Conference Paper

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