Decay mechanisms of radiation pattern and optical spectrum of high-power led modules in aging test

IEEE Journal on Selected Topics in Quantum Electronics

Volumn 15, Issue 4, 2009, Pages 1156-1162

  Tsai, Chun Chin ^a   Chen, Ming Hung ^a   Huang, Yi Chung ^a   Hsu, Yi Cheng ^b   Lo, Yuan Tsun ^a   Lin, Ying Jyun ^a   Kuang, Jao Hwa ^a   Huang, Sheng Bang ^c   Hu, Hung Lieh ^c   Su, Yeh I ^c   Cheng, Wood Hi ^a  

^a NATIONAL SUN YAT SEN UNIVERSITY   (Taiwan)

^b NATIONAL PINGTUNG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Taiwan)

^c INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE   (Taiwan)

Author keywords

Aging test; High power LED modules; Plastic lens design

Indexed keywords

A-THERMAL; AGING TEST; AGING TESTS; AGING TIME; CENTER WAVELENGTH; CONSTANT CURRENT; CONSUMER APPLICATIONS; DECAY MECHANISMS; HIGH POWER LED; HIGH-POWER LED MODULES; LENS MATERIALS; MODULE PACKAGES; OPERATING LIFE; OPTICAL POWER; OPTICAL SPECTRA; POWER DENSITIES; RADIATION PATTERNS; SIMULATED RESULTS;

DEGRADATION; OPTICAL INSTRUMENT LENSES; PLASTIC LENSES; PLASTICS; TESTING; THERMAL AGING;

POWER SPECTRUM;

EID: 70349332629     PISSN: 1077260X     EISSN: None     Source Type: Journal    
DOI: 10.1109/JSTQE.2009.2015332     Document Type: Article

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