A silicon d-spacing mapping measurement system with resolution of 10 -9

AIP Conference Proceedings

Volumn 1234, Issue , 2010, Pages 895-898

  Zhang, Xiaowei ^a   Sugiyama, Hiroshi ^a   Fugimoto, Hiroyuki ^b   Waseda, Atsushi ^b   Takatomi, Toshikazu ^a  

^a HIGH ENERGY ACCELERATOR RESEARCH ORGANIZATION KEK   (Japan)

^b NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

Author keywords

Avogadro's number; FZ Silicon; Lattice comparator; Lattice parameter of Si; X ray crystal density

Indexed keywords

EID: 77955045955     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.3463361     Document Type: Conference Paper

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