Time-resolved X-ray reflectometry in the multiwavelength dispersive geometry

AIP Conference Proceedings

Volumn 1234, Issue , 2010, Pages 927-930

  Matsushita, Tadashi ^a   Arakawa, Etsuo ^b   Harada, Tetsuo ^c   Hatano, Tadashi ^d   Higashi, Yasuo ^e   Yano, Yohko F ^f   Niwa, Yasuhiro ^a   Inada, Yasuhiro ^f   Nagano, Shusaku ^g   Seki, Takahiro ^g  

^a INSTITUTE OF MATERIALS STRUCTURE SCIENCE   (Japan)

^b TOKYO GAKUGEI UNIVERSITY   (Japan)

^c UNIVERSITY OF HYOGO   (Japan)

^d TOHOKU UNIVERSITY   (Japan)

^e HIGH ENERGY ACCELERATOR RESEARCH ORGANIZATION KEK   (Japan)

^f RITSUMEIKAN UNIVERSITY   (Japan)

^g NAGOYA UNIVERSITY   (Japan)

Author keywords

multi wavelength dispersive; time resolved X ray reflectivity

Indexed keywords

EID: 77955045418     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.3463368     Document Type: Conference Paper

References (7)

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