Influence of stacking faults on diffraction properties of diamond by synchrotron topographic imaging

AIP Conference Proceedings

Volumn 1234, Issue , 2010, Pages 191-194

  Huang, Xian Rong ^a,b   Macrander, Albert T ^a  

^a ARGONNE NATIONAL LABORATORY   (United States)

^b BROOKHAVEN NATIONAL LABORATORY   (United States)

Author keywords

characterization; defects; Diamond crystals; stacking faults; X ray optics

Indexed keywords

EID: 77955034135     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.3463170     Document Type: Conference Paper

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