Comparison of raised-microdisk whispering-gallery-mode characterization techniques

Optics Letters

Volumn 35, Issue 7, 2010, Pages 998-1000

  Redding, Brandon ^a   Marchena, Elton ^a   Creazzo, Tim ^a   Shi, Shouyuan ^a   Prather, Dennis W ^a  

^a UNIVERSITY OF DELAWARE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHARACTERIZATION; OPTICAL RESONATORS;

BENDING LOSS; CHARACTERIZATION TECHNIQUES; FAR FIELD; MICRODISK WHISPERING GALLERIES; MICRODISKS; SI NANOCRYSTAL; TAPERED FIBER;

WHISPERING GALLERY MODES;

EID: 77954939138     PISSN: 01469592     EISSN: 15394794     Source Type: Journal    
DOI: 10.1364/OL.35.000998     Document Type: Article

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