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Volumn 6, Issue SUPPL. 1, 2009, Pages
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Study of inductive coupled hydrogen and argon plasma interaction with SiO2 glass
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Author keywords
Adsorption; Atomic force microscopy (afm); Hf discharges; Inductively coupled argon hydrogen plasma; Optical spectroscopy; Plasma treatment; Surface modification
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Indexed keywords
ARGON-HYDROGEN PLASMAS;
INDUCTIVELY-COUPLED;
OPTICAL SPECTROSCOPY;
PLASMA TREATMENT;
SURFACE MODIFICATION;
ADSORPTION;
ATOMIC FORCE MICROSCOPY;
ATOMIC SPECTROSCOPY;
ELECTROMAGNETIC INDUCTION;
GLASS;
HAFNIUM;
HYDROGEN;
LIGHT SOURCES;
MOLECULES;
OXYGEN;
PLASMA APPLICATIONS;
PLASMA INTERACTIONS;
SILICON COMPOUNDS;
SURFACE DISCHARGES;
SURFACE TREATMENT;
VOLTAGE DIVIDERS;
ARGON;
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EID: 77954889716
PISSN: 16128850
EISSN: 16128869
Source Type: Journal
DOI: 10.1002/ppap.200930508 Document Type: Conference Paper |
Times cited : (8)
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References (6)
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