A nonnegative blind source separation model for binary test data

IEEE Transactions on Circuits and Systems I: Regular Papers

Volumn 57, Issue 7, 2010, Pages 1439-1448

  Schachtner, Reinhard ^a,b   Pöppel, Gerhard ^a   Lang, Elmar W ^b  

^a INFINEON TECHNOLOGIES AG   (Germany)

^b UNIVERSITY OF REGENSBURG   (Germany)

Author keywords

Binary test data; binNMF; blind source separation (BSS); nonnegative matrix factorization (NMF)

Indexed keywords

FACTORIZATION; MATRIX ALGEBRA;

BINARY DATA; BINARY TEST DATUM; BINNMF; HIDDEN INFORMATION; MICROCHIP FABRICATION; NON NEGATIVES; NONNEGATIVE MATRIX FACTORIZATION; WAFER TEST;

BLIND SOURCE SEPARATION;

EID: 77954861341     PISSN: 15498328     EISSN: None     Source Type: Journal    
DOI: 10.1109/TCSI.2010.2048778     Document Type: Article

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