Optical study of InZnO/Ag/lnZnO thin films grown on glass substrates by using spectroscopic ellipsometry: Plasmon and antireflection effects

Journal of the Korean Physical Society

Volumn 56, Issue 2, 2010, Pages 625-632

  Lee, Hosuk ^a   Park, Jun Woo ^a   Lee, Hosun ^a   Park, Yong Seok ^a   Kim, Han Ki ^a  

^a Kyung Hee University   (South Korea)

Author keywords

Ag thin films; Antireflection; Dielectric functions; Plasmon

Indexed keywords

EID: 77954841950     PISSN: 03744884     EISSN: None     Source Type: Journal    
DOI: 10.3938/jkps.56.625     Document Type: Article

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