Dependence of Curie temperature on the thickness of an ultrathin ferroelectric film

Physical Review B - Condensed Matter and Materials Physics

Volumn 81, Issue 6, 2010, Pages

  Almahmoud, Emad ^a   Kornev, Igor ^b   Bellaiche, L ^c  

^a UMM AL QURA UNIVERSITY   (Saudi Arabia)

^b ECOLE CENTRALE PARIS   (France)

^c UNIVERSITY OF ARKANSAS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 77954828948     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.81.064105     Document Type: Article

References (42)

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42. The insensitivity of the Curie temperature on the P and T parameters of Eq. is due to the fact that the polarization lies in plane for temperature below the critical temperature while these two parameters characterize effects associated with the out-of-plane direction. On the other hand, adding an energetic term characterizing the surface-induced change in in-plane dipoles in Eq. can strongly affect the Curie temperature by, e.g., making it increase as the film thickness decreases.