Finite-size scaling in thin antiferromagnetic CoO layers

Journal of Applied Physics

Volumn 79, Issue 8 PART 2B, 1996, Pages 5920-5922

  Ambrose, T ^a   Chien, C L ^a  

^a JOHNS HOPKINS UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001431768     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.362172     Document Type: Article

References (15)

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