Single-crystal EPR and ENDOR study of an Al-O- center in prehnite: Implications for aluminum-associated oxyradicals in layer silicates

European Journal of Mineralogy

Volumn 22, Issue 3, 2010, Pages 381-392

  Mao, Mao ^a   Nilges, Mark J ^b   Pan, Yuanming ^a  

^a UNIVERSITY OF SASKATCHEWAN   (Canada)

^b UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

Author keywords

ENDOR; EPR; Layer silicates; Prehnite; Radiation induced defects

Indexed keywords

ATOMIC PHYSICS; GAMMA RAYS; IRRADIATION; ISOTHERMAL ANNEALING; KAOLINITE; OXYGEN; PARAMAGNETIC RESONANCE; SILICATES; SINGLE CRYSTALS;

ELECTRON PARAMAGNETIC RESONANCES (EPR); ENDOR; GAMMA-RAY IRRADIATION; ISOCHRONAL ANNEALING; LAYER SILICATE; PREHNITE; RADIATION INDUCED DEFECTS; SPIN HAMILTONIAN PARAMETERS;

ELECTRON SPIN RESONANCE SPECTROSCOPY;

ALUMINUM; ELECTRON SPIN RESONANCE; GAMMA RAY RADIATION; KAOLINITE; MEASUREMENT METHOD; PREHNITE; QUANTITATIVE ANALYSIS; SILICATE MINERAL; SPECTROSCOPY;

EID: 77954804693     PISSN: 09351221     EISSN: None     Source Type: Journal    
DOI: 10.1127/0935-1221/2010/0022-2023     Document Type: Article

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