Domain size analysis in the Rietveld method

Materials Science Forum

Volumn 651, Issue , 2010, Pages 187-200

  David, W I F ^a   Leoni, M ^b   Scardi, P ^c  

^a RUTHERFORD APPLETON LABORATORY   (United Kingdom)

^b UNIVERSITY OF TRENTO   (Italy)

^c NONE

Author keywords

Full pattern methods; Line profile analysis; Powder diffraction; Whole powder pattern modeling; X ray diffraction

Indexed keywords

MATERIALS SCIENCE; X RAY DIFFRACTION;

ADVANCED ANALYSIS METHODS; DOMAIN SIZE; FULL PATTERN METHODS; LINE PROFILE ANALYSIS; PEAK PROFILES; POWDER DIFFRACTION; POWDER PATTERNS; WHOLE POWDER PATTERN MODELING;

RIETVELD ANALYSIS;

EID: 77954792104     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/MSF.651.187     Document Type: Conference Paper

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