Linearity and temperature dependence of large-area processed high-q barium strontium titanate thin-film varactors

IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control

Volumn 57, Issue 7, 2010, Pages 1692-1695

  Subramanyam, Guru ^a   Patterson, Mark ^a   Leedy, Kevin ^b   Neidhard, Robert ^b   Varanasi, Chakrapani ^c   Zhang, Chenhao ^a   Steinhauer, Gregg ^d  

^a University of Dayton   (United States)

^b AIR FORCE RESEARCH LABORATORY   (United States)

^c UNIVERSITY OF DAYTON RESEARCH INSTITUTE   (United States)

^d Analog Bridge Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

100-MM-DIAMETER SAPPHIRE; BST FILM; BST THIN FILMS; COMMERCIAL APPLICATIONS; DC BIAS; DIELECTRIC TUNABILITY; LOW LOSS; MILLIMETER WAVE FREQUENCIES; PULSED LASER; QUALITY FACTORS; RELATIVE DIELECTRIC PERMITTIVITY; SEMICONDUCTOR VARACTORS; TEMPERATURE DEPENDENCE; TEST STRUCTURE; TIO; VARACTOR SHUNT SWITCH; ZERO BIAS;

BARIUM; BARIUM STRONTIUM TITANATE; BARIUM TITANATE; ELECTRIC FIELDS; PULSED LASER DEPOSITION; PULSED LASERS; STRONTIUM; STRONTIUM TITANATES; THIN FILMS; VARACTORS; VARIABLE FREQUENCY OSCILLATORS;

DIELECTRIC MATERIALS;

EID: 77954776296     PISSN: 08853010     EISSN: None     Source Type: Journal    
DOI: 10.1109/TUFFC.2010.1599     Document Type: Article

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