A new method for electrical characterization of ferroelectric thin films at microwave frequencies

Ferroelectrics

Volumn 356, Issue 1 PART 2, 2007, Pages 153-157

  Subramanyam, Guru ^a  

^a UNIVERSITY OF DAYTON   (United States)

Author keywords

Capacitive test structure; Microwave characterization of ferroelectric thin films; Varactor shunt switches

Indexed keywords

DEVICE STRUCTURES; ELECTRICAL CHARACTERIZATION; FEED LINE; MICROWAVE CHARACTERIZATION; MICROWAVE CHARACTERIZATION OF FERROELECTRIC THIN FILMS; PARALLEL PLATES; S PARAMETERS; TEST STRUCTURE; VARACTOR SHUNT SWITCH;

BICMOS TECHNOLOGY; COPLANAR WAVEGUIDES; ELECTRIC SWITCHES; FERROELECTRIC THIN FILMS; FERROELECTRICITY; MICROWAVES; SCATTERING PARAMETERS; SPECTRUM ANALYZERS; VARACTORS; WIRELESS TELECOMMUNICATION SYSTEMS;

FERROELECTRIC FILMS;

EID: 60249085994     PISSN: 00150193     EISSN: 15635112     Source Type: Journal    
DOI: 10.1080/00150190701511823     Document Type: Conference Paper

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