A multiplicative model of software defect repair times

Empirical Software Engineering

Volumn 15, Issue 3, 2010, Pages 296-319

  Gokhale, Swapna S ^b   Mullen, Robert E ^a  

^a CISCO SYSTEMS   (United States)

^b NONE

Author keywords

Lognormal; Multiplicative effect; Software defect repair

Indexed keywords

ALTERNATIVE PROCESS; CISCO SYSTEM; LOG-NORMAL; LOG-NORMAL DISTRIBUTION; MULTIPLICATIVE MODEL; ORTHOGONAL DEFECT CLASSIFICATION; RATE DISTRIBUTIONS; SOFTWARE DEFECTS; TIME DISTRIBUTION; TIME MODEL;

COMPUTER SOFTWARE; DEFECTS; LAPLACE TRANSFORMS; PHOTOMASKS; WAVELET TRANSFORMS;

REPAIR;

EID: 77954756918     PISSN: 13823256     EISSN: 15737616     Source Type: Journal    
DOI: 10.1007/s10664-009-9115-y     Document Type: Article

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