From test count to code coverage using the lognormal failure rate

Proceedings - International Symposium on Software Reliability Engineering, ISSRE

Volumn , Issue , 2004, Pages 295-305

  Gokhale, Swapna S ^a   Mullen, Robert E ^b  

^a UNIVERSITY OF CONNECTICUT   (United States)

^b CISCO SYSTEMS   (United States)

Author keywords

Coverage; Lognormal; Software Reliability Growth; Software Test

Indexed keywords

COVERAGE; LOGNORMAL; SOFTWARE RELIABILITY GROWTH; SOFTWARE TESTS;

COMPUTER APPLICATIONS; COMPUTER SOFTWARE; COMPUTER SYSTEM RECOVERY; COSTS; DATA ACQUISITION; DEFECTS; MATHEMATICAL MODELS; SOFTWARE ENGINEERING;

CODES (SYMBOLS);

EID: 16244387693     PISSN: 10719458     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (31)

1. J. Aitchison and J.A.C. Brown, The Lognormal Distribution Cambridge University Press, NY, 1969.
2. H. Akaike, Prediction and Entropy, MRC Technical Summary Report #2397, NTIS, Springfield, VA, 1982.
3. P. Bishop and R. Bloomfield, "Using a Log-normal failure rate distribution for worst case bound reliability prediction", Proc. 14th International Symposium on Software Reliability Engineering, IEEE Computer Society Press, pp. 237-245, 2003.
4. M. Chen, M. R. Lyu and W. E. Wong, "Effect of code coverage on software reliability measurement," IEEE Trans. on Reliability, 50(2), 165-170, June 2001.
5. E.L. Crow and K. Shimizu, ed., Lognormal Distributions: Theory and Applications, Marcel Dekker, NY, 1988.
6. W. Fair, Handbook of Software Reliability Engineering, M. R. Lyu, Editor, chapter Software Reliability Modeling Survey, McGraw-Gill, NY, 1996.
7. F. Del Frate, P. Garg, A. Mathur, and A. Pasquini, "On the correlation between code coverage and software reliability," Proc. of Sixth Intl. Symposium on Software Reliability Engineering, pp. 124-132, October 1995.
8. W.W. Everett: "An extended execution time software reliability model", Proc. Third International Symposium on Software Reliability Engineering, IEEE Computer Society Press, pp. 4-13, 1992.
9. A. L. Goel and K. Okumoto, "Time-dependent errordetection rate models for software reliability and other performance measures," IEEE Trans. on Reliability, vol. 28(3), 1979.
10. S. Gokhale and K. S. Trivedi, "A time/structure based software reliability model," Annals of Software Engineering, 8, pp. 85-121, 1999.
11. H. Hirose, "Estimation of threshold stress in accelerated life-testing", IEEE Transactions on Reliability, vol. 42, pp. 650-657, Dec. 1993.
12. J.R. Horgan and S.A. London, "Dataflow coverage and the C Language", Proc Fourth Annual Symposium on Testing, Analysis and Verification, Victoria, British Columbia, Oct. 1991.
13. J. R. Horgan and A. P. Mathur, Handbook of Software Reliability Engineering, M. R. Lyu Editor, chapter Software Testing and Reliability, McGraw-Hill, NY, 1996.
14. N.L. Johnson, S. Kotz, and N. Balakrishnan, Continuous Univariate Distributions, vol. 1, Wiley, New York, 1994.
15. P. A. Keiller and D. R. Miller, "On the use and performance of software reliability growth models," Reliability Engineering and Systems Safety, vol. 32, 1991.
16. B. Littlewood, "A Bayesian reliability growth model for computer software," Journal of Royal Statistical Society, 22(3), 1973.
17. M. R. Lyu, J. R. Horgan and S. London, "A coverage analysis tool for the effectiveness of software testing," IEEE Trans. on Reliability, 43(4), December 1997.
18. Y. Malaiya, M. N. Li, J. M. Bieman and R. Karcich, "Software reliability growth with test coverage," IEEE Trans. on Reliability, 51(4), 420-426, December 2002.
19. D.R. Miller, Exponential Order Statistic Models of Software Reliability Growth, NASA Contractor Report 3909, NTIS, Springfield, VA 22161, 1985.
20. R.E. Mullen, "The Lognormal distribution of software failure rates: Application to software reliability growth modeling", Proc. 9th International Symposium on Software Reliability Engineering, 1998.
21. R.E. Mullen, "The Lognormal distribution of software failure rates: Origin and evidence", Proc. 9th International Symposium on Software Reliability Engineering, 1998.
22. J. D. Musa, "A theory of software reliability and its application," IEEE Trans. on Software Engineering, SE-1(1), September 1975.
23. J. D. Musa, "Operational profiles in software reliability engineering," IEEE Software. 10(2), 14-32, 1993.
24. W. Nelson, Accelerated Testing, Wiley, New York, 1990.
25. P. Piwowarski, M. Ohba and J. Caruso, "Coverage measurement experience during function testing," in Proc. of 15th Intl. Conference on Software Engineering, Baltimore, MD, 1993.
26. R. A. Sahner, K. S. Trivedi and A. Puliafito, Performance and Reliability Analysis of Computer Systems: An Example-Based Approach Using the SHARPE Software Package, Kluwer Academic Publishers, Boston, 1996.
27. Y. Sakamoto, M. Ishiguro, and G. Kitagawa, Akaike Information Criterion Statistics, D.Reidel, Holland, 1986.
28. M. A. Vouk, "Using reliability models during testing with non-operational profile," in Proc. of 2nd Bellcore/Purdue Symposium on Issues in Software Reliability Estimation, pp. 103-110, 1993.
29. W. E. Wong, J. R. Morgan, S. London and A. P. Mathur, "Effect of test set size and block coverage on fault detection effectiveness," in Proc. of 5th Intl. Symposium on Software Reliability Engineering, Monterey, CA, 1994.
30. W. E. Wong, J. R. Horgan, S. London and A. P. Mathur, "Effect of test set minimization on fault detection effectiveness," in Proc. of the 17th Intl. Conference on Software Engineering, Seattle, WA, 1995.
31. M.C.K. Yang and A. Chao, "Reliability-estimation & stopping-rules for software testing, based on repeated appearances of bugs", IEEE Trans. Reliability, vol. 44, pp. 315-321, June 1995.