Using a log-normal failure rate distribution for worst case bound reliability prediction

Proceedings - International Symposium on Software Reliability Engineering, ISSRE

Volumn 2003-January, Issue , 2003, Pages 237-245

  Bishop, P G ^a   Bloomfield, R E ^a  

^a Adelard and Centre for Software Reliability   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

FAILURE ANALYSIS; NORMAL DISTRIBUTION; RELIABILITY;

FAILURE RATE; LOG-NORMAL; LOG-NORMAL DISTRIBUTION; PROGRAM STRUCTURES; RELIABILITY GROWTH MODEL; RELIABILITY PREDICTION;

SOFTWARE RELIABILITY;

EID: 16244392968     PISSN: 10719458     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISSRE.2003.1251046     Document Type: Conference Paper

References (9)

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