Multiferroic properties of Bi(Fe0.5Sc0.5)O 3-Pb TiO3 thin films

Physica Scripta T

Volumn T139, Issue , 2010, Pages

  Yan, F ^a   Sterianou, I ^b   Miao, S ^b   Reaney, I M ^b   Lai, M O ^a   Lu, L ^a  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

^b UNIVERSITY OF SHEFFIELD   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

COERCIVE FIELD; DEPOSITION CONDITIONS; FERROELECTRIC SWITCHING; FERROMAGNETIC PROPERTIES; MAGNETIC MEASUREMENTS; MICROSTRUCTURE-PROPERTY RELATION; MULTIFERROIC PROPERTIES; ORDERS OF MAGNITUDE; PT FILMS; REMNANT POLARIZATIONS; SI SUBSTRATES; TIO;

FERROELECTRICITY; FUNCTIONAL MATERIALS; LEAD; MAGNETIC MATERIALS; MAGNETIC MOMENTS; PLATINUM; PULSED LASER DEPOSITION; PULSED LASERS; SCANDIUM; SCANNING ELECTRON MICROSCOPY; SILICON; SILICON COMPOUNDS; THIN FILMS; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

FERROELECTRIC FILMS;

EID: 77954738660     PISSN: 02811847     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1088/0031-8949/2010/T139/014003     Document Type: Conference Paper

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