메뉴 건너뛰기




Volumn 80, Issue 8, 2010, Pages 903-914

Accelerated life test sampling plans for the Weibull distribution under Type I progressive interval censoring with random removals

Author keywords

Accelerated life tests; Generalized asymptotic variance; Maximum likelihood estimation; Sampling plan; Type I progressive interval censoring

Indexed keywords


EID: 77954678674     PISSN: 00949655     EISSN: 15635163     Source Type: Journal    
DOI: 10.1080/00949650902834478     Document Type: Article
Times cited : (25)

References (22)
  • 2
    • 33749541601 scopus 로고
    • Design of failure censored accelerated life-test sampling plans for lognormal and Weibull distributions
    • D.S. Bai, J.G. Kim, and Y.R. Chun, Design of failure censored accelerated life-test sampling plans for lognormal and Weibull distributions, Eng. Oper. 21 (1993), pp. 197-212.
    • (1993) Eng. Oper , vol.21 , pp. 197-212
    • Bai, D.S.1    Kim, J.G.2    Chun, Y.R.3
  • 3
    • 0011701871 scopus 로고
    • Life-test sampling plans for two-parameter Weibull populations
    • K.W. Fertig and N.R. Mann, Life-test sampling plans for two-parameter Weibull populations, Technometrics 22 (1980), pp. 165-177.
    • (1980) Technometrics , vol.22 , pp. 165-177
    • Fertig, K.W.1    Mann, N.R.2
  • 4
    • 0011632576 scopus 로고
    • Design of single sampling plans for doubly exponential characteristics
    • H.J. Lenz, G.B. Wetherill, and P.T. Wilrich, eds., Physica-Verlag, Vienna
    • Y. Hosono, H. Ohta, and S. Kase, Design of single sampling plans for doubly exponential characteristics, in Frontiers in Quality Control, H.J. Lenz, G.B. Wetherill, and P.T. Wilrich, eds., Physica-Verlag, Vienna, 1981, pp. 94-112.
    • (1981) Frontiers In Quality Control , pp. 94-112
    • Hosono, Y.1    Ohta, H.2    Kase, S.3
  • 5
    • 0011701277 scopus 로고
    • One- and two-sided sampling plans based on the exponential distribution
    • S. Kocherlakota and N. Balakrishnan, One- and two-sided sampling plans based on the exponential distribution, Naval Res. Logist. Quart. 33 (1986), pp. 513-522.
    • (1986) Naval Res. Logist. Quart , vol.33 , pp. 513-522
    • Kocherlakota, S.1    Balakrishnan, N.2
  • 6
    • 6444245481 scopus 로고    scopus 로고
    • Bayesian sampling plans for exponential distribution based on type I censoring data
    • Y.P. Lin, T. C. Liang, and W.T. Huang, Bayesian sampling plans for exponential distribution based on type I censoring data, Ann. Inst. Statist. Math. 54 (2002), pp. 100-113.
    • (2002) Ann. Inst. Statist. Math , vol.54 , pp. 100-113
    • Lin, Y.P.1    Liang, T.C.2    Huang, W.T.3
  • 7
    • 21844501273 scopus 로고
    • Bayesian variable sampling plans for the exponential distribution with type I censoring
    • L. Yeh, Bayesian variable sampling plans for the exponential distribution with type I censoring, Ann. Statist. 22 (1994), pp. 696-711.
    • (1994) Ann. Statist , vol.22 , pp. 696-711
    • Yeh, L.1
  • 9
    • 0034197608 scopus 로고    scopus 로고
    • Reliability sampling plans for lognormal distribution based on progressively-censored samples
    • U. Balasooriya and N. Balakrishnan, Reliability sampling plans for lognormal distribution based on progressively-censored samples, IEEE Trans. Reliab. 49 (2000), pp. 199-203.
    • (2000) IEEE Trans. Reliab , vol.49 , pp. 199-203
    • Balasooriya, U.1    Balakrishnan, N.2
  • 10
    • 0011578218 scopus 로고    scopus 로고
    • Reliability sampling plans for the two-parameter exponential distribution under progressive censoring
    • U. Balasooriya and L.C. Saw, Reliability sampling plans for the two-parameter exponential distribution under progressive censoring, J. Appl. Statist. 25 (1998), pp. 707-714.
    • (1998) J. Appl. Statist , vol.25 , pp. 707-714
    • Balasooriya, U.1    Saw, L.C.2
  • 11
    • 0034187355 scopus 로고    scopus 로고
    • Progressively censored reliability sampling plans for the Weibull distribution
    • U. Balasooriya, L.C. Saw, and V. Gadag, Progressively censored reliability sampling plans for the Weibull distribution, Technometrics 42 (2000), pp. 160-167.
    • (2000) Technometrics , vol.42 , pp. 160-167
    • Balasooriya, U.1    Saw, L.C.2    Gadag, V.3
  • 12
    • 31144461376 scopus 로고    scopus 로고
    • Progressively censored variables sampling plans for two-parameter exponential distributions
    • A.J. Fernandez, Progressively censored variables sampling plans for two-parameter exponential distributions, J. Appl. Statist. 32 (2005), pp. 823-829.
    • (2005) J. Appl. Statist , vol.32 , pp. 823-829
    • Fernandez, A.J.1
  • 13
    • 0024018141 scopus 로고
    • Progressively-censored aging tests on XLPE-insulated cable models
    • G.C. Montanari and M. Cacciari, Progressively-censored aging tests on XLPE-insulated cable models, IEEE Trans. Electr. Insul. 23 (1988), pp. 365-372.
    • (1988) IEEE Trans. Electr. Insul , vol.23 , pp. 365-372
    • Montanari, G.C.1    Cacciari, M.2
  • 14
    • 0013258605 scopus 로고    scopus 로고
    • Expected experiment times for the Weibull distribution under progressive censoring with random removals
    • S.K. Tse and H.K. Yuen, Expected experiment times for the Weibull distribution under progressive censoring with random removals, J. Appl. Statist. 25 (1998), pp. 75-83.
    • (1998) J. Appl. Statist , vol.25 , pp. 75-83
    • Tse, S.K.1    Yuen, H.K.2
  • 15
    • 0000279408 scopus 로고    scopus 로고
    • Statistical analysis of Weibull distributed lifetime data under type II progressive censoring with binomial removals
    • S.K. Tse, C.Y.Yang, and H.K.Yuen, Statistical analysis of Weibull distributed lifetime data under type II progressive censoring with binomial removals, J. Appl. Statist. 27 (2000), pp. 1033-1043.
    • (2000) J. Appl. Statist , vol.27 , pp. 1033-1043
    • Tse, S.K.1    Yang, C.Y.2    Yuen, H.K.3
  • 16
    • 0030372559 scopus 로고    scopus 로고
    • Parameters estimation for Weibull distributed lifetimes under progressive censoring with random removals
    • H.K. Yuen and S.K. Tse, Parameters estimation for Weibull distributed lifetimes under progressive censoring with random removals, J. Statist. Comput. Simul. 55 (1996), pp. 57-71.
    • (1996) J. Statist. Comput. Simul , vol.55 , pp. 57-71
    • Yuen, H.K.1    Tse, S.K.2
  • 17
    • 0038602798 scopus 로고    scopus 로고
    • Reliability sampling plans for the Weibull distribution under type II progressive censoring with binomial removals
    • S.K. Tse and C. Y. Yang, Reliability sampling plans for the Weibull distribution under type II progressive censoring with binomial removals, J. Appl. Statist. 30 (2003), pp. 709-718.
    • (2003) J. Appl. Statist , vol.30 , pp. 709-718
    • Tse, S.K.1    Yang, C.Y.2
  • 18
    • 0020702715 scopus 로고
    • Present practice and future plans for MIL-STD-781
    • W. E. Wallace Jr., Present practice and future plans for MIL-STD-781, Naval Res. Logist. Quart. 32 (1985), pp. 21-26.
    • (1985) Naval Res. Logist. Quart , vol.32 , pp. 21-26
    • Wallace Jr., W.E.1
  • 19
    • 21844517410 scopus 로고
    • Failure-censored reliability sampling plans for the exponential distribution
    • U. Balasooriya, Failure-censored reliability sampling plans for the exponential distribution, J. Statist. Comput. Simul. 52 (1995), pp. 337-349.
    • (1995) J. Statist. Comput. Simul , vol.52 , pp. 337-349
    • Balasooriya, U.1
  • 20
    • 33749563739 scopus 로고
    • Accelerated life test sampling plans for exponential distributions
    • H.K. Hsieh, Accelerated life test sampling plans for exponential distributions, Commun. Statist. Simul. Comput. 23 (1994), pp. 27-41.
    • (1994) Commun. Statist. Simul. Comput , vol.23 , pp. 27-41
    • Hsieh, H.K.1
  • 21
    • 33644884199 scopus 로고    scopus 로고
    • Planning step-stress life test with progressively type I group-censored exponential data
    • S. J. Wu, Y. P. Lin, and Y. J. Chen, Planning step-stress life test with progressively type I group-censored exponential data, Statist. Neerlandica 60 (2006), pp. 46-56.
    • (2006) Statist. Neerlandica , vol.60 , pp. 46-56
    • Wu, S.J.1    Lin, Y.P.2    Chen, Y.J.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.