-
2
-
-
33749541601
-
Design of failure censored accelerated life-test sampling plans for lognormal and Weibull distributions
-
D.S. Bai, J.G. Kim, and Y.R. Chun, Design of failure censored accelerated life-test sampling plans for lognormal and Weibull distributions, Eng. Oper. 21 (1993), pp. 197-212.
-
(1993)
Eng. Oper
, vol.21
, pp. 197-212
-
-
Bai, D.S.1
Kim, J.G.2
Chun, Y.R.3
-
3
-
-
0011701871
-
Life-test sampling plans for two-parameter Weibull populations
-
K.W. Fertig and N.R. Mann, Life-test sampling plans for two-parameter Weibull populations, Technometrics 22 (1980), pp. 165-177.
-
(1980)
Technometrics
, vol.22
, pp. 165-177
-
-
Fertig, K.W.1
Mann, N.R.2
-
4
-
-
0011632576
-
Design of single sampling plans for doubly exponential characteristics
-
H.J. Lenz, G.B. Wetherill, and P.T. Wilrich, eds., Physica-Verlag, Vienna
-
Y. Hosono, H. Ohta, and S. Kase, Design of single sampling plans for doubly exponential characteristics, in Frontiers in Quality Control, H.J. Lenz, G.B. Wetherill, and P.T. Wilrich, eds., Physica-Verlag, Vienna, 1981, pp. 94-112.
-
(1981)
Frontiers In Quality Control
, pp. 94-112
-
-
Hosono, Y.1
Ohta, H.2
Kase, S.3
-
5
-
-
0011701277
-
One- and two-sided sampling plans based on the exponential distribution
-
S. Kocherlakota and N. Balakrishnan, One- and two-sided sampling plans based on the exponential distribution, Naval Res. Logist. Quart. 33 (1986), pp. 513-522.
-
(1986)
Naval Res. Logist. Quart
, vol.33
, pp. 513-522
-
-
Kocherlakota, S.1
Balakrishnan, N.2
-
6
-
-
6444245481
-
Bayesian sampling plans for exponential distribution based on type I censoring data
-
Y.P. Lin, T. C. Liang, and W.T. Huang, Bayesian sampling plans for exponential distribution based on type I censoring data, Ann. Inst. Statist. Math. 54 (2002), pp. 100-113.
-
(2002)
Ann. Inst. Statist. Math
, vol.54
, pp. 100-113
-
-
Lin, Y.P.1
Liang, T.C.2
Huang, W.T.3
-
7
-
-
21844501273
-
Bayesian variable sampling plans for the exponential distribution with type I censoring
-
L. Yeh, Bayesian variable sampling plans for the exponential distribution with type I censoring, Ann. Statist. 22 (1994), pp. 696-711.
-
(1994)
Ann. Statist
, vol.22
, pp. 696-711
-
-
Yeh, L.1
-
9
-
-
0034197608
-
Reliability sampling plans for lognormal distribution based on progressively-censored samples
-
U. Balasooriya and N. Balakrishnan, Reliability sampling plans for lognormal distribution based on progressively-censored samples, IEEE Trans. Reliab. 49 (2000), pp. 199-203.
-
(2000)
IEEE Trans. Reliab
, vol.49
, pp. 199-203
-
-
Balasooriya, U.1
Balakrishnan, N.2
-
10
-
-
0011578218
-
Reliability sampling plans for the two-parameter exponential distribution under progressive censoring
-
U. Balasooriya and L.C. Saw, Reliability sampling plans for the two-parameter exponential distribution under progressive censoring, J. Appl. Statist. 25 (1998), pp. 707-714.
-
(1998)
J. Appl. Statist
, vol.25
, pp. 707-714
-
-
Balasooriya, U.1
Saw, L.C.2
-
11
-
-
0034187355
-
Progressively censored reliability sampling plans for the Weibull distribution
-
U. Balasooriya, L.C. Saw, and V. Gadag, Progressively censored reliability sampling plans for the Weibull distribution, Technometrics 42 (2000), pp. 160-167.
-
(2000)
Technometrics
, vol.42
, pp. 160-167
-
-
Balasooriya, U.1
Saw, L.C.2
Gadag, V.3
-
12
-
-
31144461376
-
Progressively censored variables sampling plans for two-parameter exponential distributions
-
A.J. Fernandez, Progressively censored variables sampling plans for two-parameter exponential distributions, J. Appl. Statist. 32 (2005), pp. 823-829.
-
(2005)
J. Appl. Statist
, vol.32
, pp. 823-829
-
-
Fernandez, A.J.1
-
13
-
-
0024018141
-
Progressively-censored aging tests on XLPE-insulated cable models
-
G.C. Montanari and M. Cacciari, Progressively-censored aging tests on XLPE-insulated cable models, IEEE Trans. Electr. Insul. 23 (1988), pp. 365-372.
-
(1988)
IEEE Trans. Electr. Insul
, vol.23
, pp. 365-372
-
-
Montanari, G.C.1
Cacciari, M.2
-
14
-
-
0013258605
-
Expected experiment times for the Weibull distribution under progressive censoring with random removals
-
S.K. Tse and H.K. Yuen, Expected experiment times for the Weibull distribution under progressive censoring with random removals, J. Appl. Statist. 25 (1998), pp. 75-83.
-
(1998)
J. Appl. Statist
, vol.25
, pp. 75-83
-
-
Tse, S.K.1
Yuen, H.K.2
-
15
-
-
0000279408
-
Statistical analysis of Weibull distributed lifetime data under type II progressive censoring with binomial removals
-
S.K. Tse, C.Y.Yang, and H.K.Yuen, Statistical analysis of Weibull distributed lifetime data under type II progressive censoring with binomial removals, J. Appl. Statist. 27 (2000), pp. 1033-1043.
-
(2000)
J. Appl. Statist
, vol.27
, pp. 1033-1043
-
-
Tse, S.K.1
Yang, C.Y.2
Yuen, H.K.3
-
16
-
-
0030372559
-
Parameters estimation for Weibull distributed lifetimes under progressive censoring with random removals
-
H.K. Yuen and S.K. Tse, Parameters estimation for Weibull distributed lifetimes under progressive censoring with random removals, J. Statist. Comput. Simul. 55 (1996), pp. 57-71.
-
(1996)
J. Statist. Comput. Simul
, vol.55
, pp. 57-71
-
-
Yuen, H.K.1
Tse, S.K.2
-
17
-
-
0038602798
-
Reliability sampling plans for the Weibull distribution under type II progressive censoring with binomial removals
-
S.K. Tse and C. Y. Yang, Reliability sampling plans for the Weibull distribution under type II progressive censoring with binomial removals, J. Appl. Statist. 30 (2003), pp. 709-718.
-
(2003)
J. Appl. Statist
, vol.30
, pp. 709-718
-
-
Tse, S.K.1
Yang, C.Y.2
-
18
-
-
0020702715
-
Present practice and future plans for MIL-STD-781
-
W. E. Wallace Jr., Present practice and future plans for MIL-STD-781, Naval Res. Logist. Quart. 32 (1985), pp. 21-26.
-
(1985)
Naval Res. Logist. Quart
, vol.32
, pp. 21-26
-
-
Wallace Jr., W.E.1
-
19
-
-
21844517410
-
Failure-censored reliability sampling plans for the exponential distribution
-
U. Balasooriya, Failure-censored reliability sampling plans for the exponential distribution, J. Statist. Comput. Simul. 52 (1995), pp. 337-349.
-
(1995)
J. Statist. Comput. Simul
, vol.52
, pp. 337-349
-
-
Balasooriya, U.1
-
20
-
-
33749563739
-
Accelerated life test sampling plans for exponential distributions
-
H.K. Hsieh, Accelerated life test sampling plans for exponential distributions, Commun. Statist. Simul. Comput. 23 (1994), pp. 27-41.
-
(1994)
Commun. Statist. Simul. Comput
, vol.23
, pp. 27-41
-
-
Hsieh, H.K.1
-
21
-
-
33644884199
-
Planning step-stress life test with progressively type I group-censored exponential data
-
S. J. Wu, Y. P. Lin, and Y. J. Chen, Planning step-stress life test with progressively type I group-censored exponential data, Statist. Neerlandica 60 (2006), pp. 46-56.
-
(2006)
Statist. Neerlandica
, vol.60
, pp. 46-56
-
-
Wu, S.J.1
Lin, Y.P.2
Chen, Y.J.3
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