A review of flicker severity assessment by the IEC flickermeter

IEEE Transactions on Instrumentation and Measurement

Volumn 59, Issue 8, 2010, Pages 2037-2047

  Ruiz, J ^a   Gutierrez, J J ^a   Lazkano, A ^a   Ruiz De Gauna, S ^a  

^a UNIVERSITY OF THE BASQUE COUNTRY UPV EHU   (Spain)

Author keywords

Flicker; International Electrotechnical Commission (IEC) flickermeter; P st; power quality; rectangular voltage fluctuation

Indexed keywords

FIELD MEASUREMENT; FLICKER METER; IEC FLICKER METERS; INTERNATIONAL ELECTROTECHNICAL COMMISSION; INTERNATIONAL ELECTROTECHNICAL COMMISSION (IEC) FLICKERMETER; LIGHT FLUCTUATION; NONUNIFORM; QUANTITATIVE VALUES; REAL SITUATION; REALISTIC CONDITIONS; SMALL GROUPS; SUBJECTIVE TESTS; VOLTAGE FLUCTUATIONS;

FLICKERING;

EID: 77954625482     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2009.2031846     Document Type: Article

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