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Volumn 18, Issue 3, 2003, Pages 1088-1097

Voltage and lamp flicker issues: Should the IEEE adopt the IEC approach?

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC POTENTIAL; ELECTRIC POWER SYSTEMS; ELECTRIC UTILITIES; STANDARDS;

EID: 0037479974     PISSN: 08858977     EISSN: None     Source Type: Journal    
DOI: 10.1109/TPWRD.2003.814261     Document Type: Review
Times cited : (48)

References (8)
  • 2
    • 0037678169 scopus 로고    scopus 로고
    • UIE/IEC flicker standard for use in North America: Measuring techniques and practical applications
    • Columbus, OH, Mar.
    • M. Sakulin and T. S. Key, "UIE/IEC flicker standard for use in North America: measuring techniques and practical applications," in Proc. Power Quality Assurance, Columbus, OH, Mar. 1997.
    • (1997) Proc. Power Quality Assurance
    • Sakulin, M.1    Key, T.S.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.