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Volumn 8, Issue 6, 1998, Pages 429-436

Calculating a new reference point for the IEC-flickermeter

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0003340924     PISSN: 1430144X     EISSN: None     Source Type: Journal    
DOI: 10.1002/etep.4450080604     Document Type: Article
Times cited : (26)

References (6)
  • 1
    • 33746594993 scopus 로고
    • International Union for Electro-Heat Disturbances Study Committee Flicker Measuring Methods WG, Paris
    • U.I.E Flickermeter: Functional and Design Specifications International Union for Electro-Heat Disturbances Study Committee Flicker Measuring Methods WG, Paris 1983
    • (1983) Functional and Design Specifications
    • Flickermeter, U.I.E.1
  • 5
    • 33746620992 scopus 로고
    • Flicker simulation and minimization
    • Brighton/UK IEE Conf. Publ. No. 305
    • Mombauer, W.: Flicker simulation and minimization. 10th Int. Conf. on Electr. Distrib. (CIRED), Brighton/UK 1989, IEE Conf. Publ. No. 305
    • (1989) 10th Int. Conf. on Electr. Distrib. (CIRED)
    • Mombauer, W.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.