Measurements of extreme physical phenomena by Fourier fringe analysis

AIP Conference Proceedings

Volumn 1236, Issue , 2010, Pages 445-448

  Takeda, Mitsuo ^a  

^a UNIVERSITY OF ELECTRO COMMUNICATIONS   (Japan)

Author keywords

Fringe analysis; Interferometry; Optical metrology; Phase measurement

Indexed keywords

EID: 77954594225     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.3426157     Document Type: Conference Paper

References (14)

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