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Volumn 7, Issue 2, 2010, Pages 276-279
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Comprehensive model for interface recombination at a-Si:H/c-Si interfaces based on amphoteric defects
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Author keywords
[No Author keywords available]
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Indexed keywords
A-SI:H;
ACCURATE MODELING;
AMPHOTERIC NATURE;
C-SI SOLAR CELL;
CELL DESIGN;
CELL DEVELOPMENT;
CELL PERFORMANCE;
COMPREHENSIVE MODEL;
CRYSTALLINE SILICONS;
DEFECT STATE;
DENSITY OF DEFECTS;
ELECTRONIC PASSIVATION;
EXPERIMENTAL DATA;
HETERO INTERFACES;
HYDROGENATED AMORPHOUS SILICON (A-SI:H);
INTERFACE RECOMBINATION;
NUMERICAL COMPARISON;
PHYSICAL MODEL;
PHYSICAL PARAMETERS;
RECOMBINATION MODEL;
SURFACE PASSIVATION;
AMORPHOUS SILICON;
DEFECT DENSITY;
DEFECTS;
NANOSCIENCE;
PASSIVATION;
SEMICONDUCTING SILICON;
SEMICONDUCTOR DEVICE MANUFACTURE;
SEMICONDUCTOR DEVICE MODELS;
SILICON SOLAR CELLS;
SILICON WAFERS;
SOLAR CELLS;
SEMICONDUCTING SILICON COMPOUNDS;
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EID: 77954342823
PISSN: 18626351
EISSN: 16101642
Source Type: Journal
DOI: 10.1002/pssc.200982486 Document Type: Conference Paper |
Times cited : (4)
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References (17)
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