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Volumn 7, Issue 2, 2010, Pages 276-279

Comprehensive model for interface recombination at a-Si:H/c-Si interfaces based on amphoteric defects

Author keywords

[No Author keywords available]

Indexed keywords

A-SI:H; ACCURATE MODELING; AMPHOTERIC NATURE; C-SI SOLAR CELL; CELL DESIGN; CELL DEVELOPMENT; CELL PERFORMANCE; COMPREHENSIVE MODEL; CRYSTALLINE SILICONS; DEFECT STATE; DENSITY OF DEFECTS; ELECTRONIC PASSIVATION; EXPERIMENTAL DATA; HETERO INTERFACES; HYDROGENATED AMORPHOUS SILICON (A-SI:H); INTERFACE RECOMBINATION; NUMERICAL COMPARISON; PHYSICAL MODEL; PHYSICAL PARAMETERS; RECOMBINATION MODEL; SURFACE PASSIVATION;

EID: 77954342823     PISSN: 18626351     EISSN: 16101642     Source Type: Journal    
DOI: 10.1002/pssc.200982486     Document Type: Conference Paper
Times cited : (4)

References (17)
  • 13
    • 0036948749 scopus 로고    scopus 로고
    • Very low surface recombination velocities on p- and n-type silicon wafers passivated with hydrogenated amorphous silicon films
    • S. Dauwe, J. Schmidt, and R. Hezel, Very low surface recombination velocities on p- and n-type silicon wafers passivated with hydrogenated amorphous silicon films, in: Proc. IEEE PVSC, (2002), p. 1246.
    • (2002) Proc. IEEE PVSC , pp. 1246
    • Dauwe, S.1    Schmidt, J.2    Hezel, R.3
  • 16
    • 77954345934 scopus 로고    scopus 로고
    • -3.
    • -3.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.