A two-dimensional analytical method for the transformation crystallography based on vector analysis

Philosophical Magazine

Volumn 90, Issue 24, 2010, Pages 3281-3292

  Gu, X F ^a   Zhang, W Z ^a  

^a TSINGHUA UNIVERSITY   (China)

Author keywords

edge to edge matching model; habit plane; interfacial structure; O line model; orientation relationship

Indexed keywords

EDGE-TO-EDGE MATCHING; HABIT PLANE; INTERFACIAL STRUCTURES; LINE MODELS; ORIENTATION RELATIONSHIP;

CRYSTALLOGRAPHY;

VECTORS;

EID: 77954332073     PISSN: 14786435     EISSN: 14786443     Source Type: Journal    
DOI: 10.1080/14786435.2010.484404     Document Type: Article

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