메뉴 건너뛰기




Volumn 48, Issue 12, 2000, Pages 3253-3260

Analysis of a two-dimensional invariant line interface for the case of a general transformation strain and application to thin-film interfaces

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLOGRAPHY; EIGENVALUES AND EIGENFUNCTIONS; EXPANSION; FILM GROWTH; GRAIN BOUNDARIES; MATHEMATICAL MODELS; PHASE TRANSITIONS; SHEAR DEFORMATION; SHRINKAGE; THIN FILMS; TWO DIMENSIONAL;

EID: 0034228346     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1359-6454(00)00116-6     Document Type: Article
Times cited : (28)

References (16)
  • 1
    • 0004272698 scopus 로고    scopus 로고
    • Interfaces in Materials: Atomic Structure, Thermodynamics and Kinetics of Solid-Vapor
    • John Wiley, New York
    • Howe, J. M., Interfaces in Materials: Atomic Structure, Thermodynamics and Kinetics of Solid-Vapor, Solid-Liquid and Solid-Solid Interfaces in Materials. John Wiley, New York, 1997, pp. 377-442.
    • (1997) Solid-Liquid and Solid-Solid Interfaces in Materials , pp. 377-442
    • Howe, J.M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.