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Volumn 48, Issue 12, 2000, Pages 3253-3260
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Analysis of a two-dimensional invariant line interface for the case of a general transformation strain and application to thin-film interfaces
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Author keywords
[No Author keywords available]
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Indexed keywords
CRYSTALLOGRAPHY;
EIGENVALUES AND EIGENFUNCTIONS;
EXPANSION;
FILM GROWTH;
GRAIN BOUNDARIES;
MATHEMATICAL MODELS;
PHASE TRANSITIONS;
SHEAR DEFORMATION;
SHRINKAGE;
THIN FILMS;
TWO DIMENSIONAL;
THIN FILM INTERFACES;
TWO DIMENSIONAL DEFORMATION MATRIX;
TWO DIMENSIONAL INVARIANT LINE INTERFACE;
PHASE INTERFACES;
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EID: 0034228346
PISSN: 13596454
EISSN: None
Source Type: Journal
DOI: 10.1016/S1359-6454(00)00116-6 Document Type: Article |
Times cited : (28)
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References (16)
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