The electron and crystalline structure features of ionsynthesized nanocomposite of Si nanocrystals in Al2O3 matrix revealed by electron spectroscopy

Journal of Physics: Conference Series

Volumn 100, Issue PART 7, 2008, Pages

  Kovalev, A ^a   Wainstein, D ^a   Tetelbaum, D ^a,b   Mikhaylov, A ^a,b   Pavesi, L ^c   Ferrarioli, L ^c   Ershov, A ^b   Belov, A ^b  

^a CNIICHERMET   (Russian Federation)

^b LOBACHEVSKY STATE UNIVERSITY OF NIZHNY NOVGOROD   (Russian Federation)

^c UNIVERSITY OF TRENTO   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; CRYSTALLINE MATERIALS; DEFECTS; DEPTH PROFILING; ELECTRON GUNS; ELECTRON SPECTROSCOPY; ELECTRON TRANSITIONS; ELECTRONS; ION IMPLANTATION; LIGHT EMISSION; NANOCRYSTALS; NONVOLATILE STORAGE; SAPPHIRE; SILICON; ALUMINA; ALUMINUM OXIDE; NANOSCIENCE;

CRYSTALLINE STRUCTURE; DEPTH DISTRIBUTION; LIGHT EMITTING PROPERTIES; MATRIX DEFECTS; NON-RADIATIVE TRANSITIONS; POSTIMPLANTATION ANNEALING; SI NANOCRYSTAL; XPS DEPTH PROFILING; MATRIX LATTICE;

SILICON WAFERS;

EID: 77954323992     PISSN: 17426588     EISSN: 17426596     Source Type: Conference Proceeding    
DOI: 10.1088/1742-6596/100/7/072012     Document Type: Conference Paper

References (5)

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