Combined synchrotron XRD/Raman measurements: In situ identification of polymorphic transitions during crystallization processes

Langmuir

Volumn 26, Issue 13, 2010, Pages 11233-11237

  Klimakow, Maria ^a   Leiterer, Jork ^a   Kneipp, Janina ^a,b   Rössler, Ernst ^c   Panne, Ulrich ^a,b   Rademann, Klaus ^b   Emmerling, Franziska ^a  

^a BAM FEDERAL INSTITUTE FOR MATERIALS RESEARCH AND TESTING   (Germany)

^b HUMBOLDT UNIVERSITY   (Germany)

^c UNIVERSITY OF BAYREUTH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ANALYTICAL METHOD; CRYSTALLIZATION PROCESS; DIFFERENT SOLVENTS; IN-SITU; MOLECULAR ASSEMBLY; NIFEDIPINE; PHASE CONTENT; POLYMORPHIC COMPOUNDS; POLYMORPHIC PHASE TRANSITION; POLYMORPHIC TRANSITIONS; RAMAN DATA; REAL TIME MEASUREMENTS; SAMPLE ENVIRONMENT; STABLE SYSTEMS; TIME-RESOLVED X-RAY DIFFRACTION; TRANSIENT PHASIS; XRD;

ACETONE; ACETONITRILE; CARBOXYLIC ACIDS; CRYSTAL STRUCTURE; CRYSTALLIZATION; DICHLOROMETHANE; ESTERS; ETHANOL; LATTICE CONSTANTS; METHANOL; ORGANIC SOLVENTS; RAMAN SPECTROSCOPY; TIME MEASUREMENT; X RAY DIFFRACTION;

PHASE TRANSITIONS;

ARTICLE; CHEMICAL STRUCTURE; CRYSTALLIZATION; RAMAN SPECTROMETRY; SYNCHROTRON; THEORETICAL MODEL; X RAY DIFFRACTION;

CRYSTALLIZATION; MODELS, THEORETICAL; MOLECULAR STRUCTURE; SPECTRUM ANALYSIS, RAMAN; SYNCHROTRONS; X-RAY DIFFRACTION;

EID: 77954277560     PISSN: 07437463     EISSN: 15205827     Source Type: Journal    
DOI: 10.1021/la100540q     Document Type: Article

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