AES of thin oxide layers on a duplex stainless steel surface

Surface and Interface Analysis

Volumn 42, Issue 6-7, 2010, Pages 762-765

  Mandrino, Djordje ^a   Donik, Črtomir ^a   Jenko, Monika ^a  

^a INSTITUTE OF METALS AND TECHNOLOGY   (Slovenia)

Author keywords

AES; Depth profile; Duplex stainless steel; Oxide layer

Indexed keywords

AES DEPTH PROFILE; AMBIENT CONDITIONS; AUGER PEAK; DUPLEX STAINLESS STEEL; HIGH RESOLUTION; LINEAR LEAST SQUARES; OXIDE LAYER; PLASMA PASSIVATION; SEM; STRATIFIED STRUCTURE; THIN OXIDE LAYERS; X-RAY PHOTOELECTRON SPECTROSCOPY STUDIES;

AUGER ELECTRON SPECTROSCOPY; AUGERS; CHROMIUM; CORROSION RESISTANT ALLOYS; PASSIVATION; STEEL CORROSION; X RAY PHOTOELECTRON SPECTROSCOPY;

STAINLESS STEEL;

EID: 77954260086     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.3212     Document Type: Conference Paper

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