Predicting the wettability of patterned ITO surface using ToF-SIMS images

Surface and Interface Analysis

Volumn 42, Issue 6-7, 2010, Pages 911-915

  Yang, L ^a   Shard, A G ^a   Lee, J L S ^a   Ray, S ^a  

^a NATIONAL PHYSICAL LABORATORY   (United Kingdom)

Author keywords

Partial least square; SIMS; Wettability

Indexed keywords

DATA SETS; DIRECT CONTACT; DIRECT MEASUREMENT; INDIUM TIN OXIDE; LINEAR RELATION; LIQUID DROP; MEASURES OF PERFORMANCE; PARTIAL LEAST SQUARES; PARTIAL LEAST-SQUARES REGRESSION; PATTERNED ITO; PLASTIC ELECTRONICS; PLS MODELS; QUANTITATIVE PREDICTION; SPATIAL VARIATIONS; TIME OF FLIGHT SECONDARY ION MASS SPECTROMETRY; TOF SIMS; TOF-SIMS IMAGING; WATER CONTACT ANGLE; WATER DROPLETS;

ANGLE MEASUREMENT; CONTACT ANGLE; PRINCIPAL COMPONENT ANALYSIS; TIN; TITANIUM COMPOUNDS;

SECONDARY ION MASS SPECTROMETRY;

EID: 77954248616     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.3244     Document Type: Conference Paper

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