Determination of wettability of surface-modified hot-embossed polycarbonate wafers used in microfluidic device fabrication via XPS and ToF-SIMS

Surface and Interface Analysis

Volumn 40, Issue 3-4, 2008, Pages 358-363

  Baytekin, H Tarik ^a   Wirth, Thomas ^a   Gross, Thomas ^a   Treu, Dieter ^a   Sahre, Mario ^a   Theisen, Janko ^b   Schmidt, Martin ^b   Unger, Wolfgang E S ^a  

^a BAM FEDERAL INSTITUTE FOR MATERIALS RESEARCH AND TESTING   (Germany)

^b TECHNISCHE UNIVERSITÄT BERLIN   (Germany)

Author keywords

Oxygen plasma; Polycarbonate; Principal component analysis; Tof sims; XPS

Indexed keywords

MICROCHANNELS; MICROFLUIDICS; WETTING; X RAY PHOTOELECTRON SPECTROSCOPY;

POLYCARBONATE WAFERS; POLYMER WAFERS;

POLYCARBONATES;

EID: 42449142670     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.2724     Document Type: Conference Paper

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