Investigations of electrical trees in the inner layer of XLPE cable insulation using computer-aided image recording monitoring

IEEE Transactions on Dielectrics and Electrical Insulation

Volumn 17, Issue 3, 2010, Pages 685-693

  Xie, Ansheng ^a,b   Zheng, Xiaoquan ^a   Li, Shengtao ^a   Chen, George ^c  

^a XI'AN JIAOTONG UNIVERSITY   (China)

^b CHANG'AN UNIVERSITY   (China)

^c UNIVERSITY OF SOUTHAMPTON   (United Kingdom)

Author keywords

Cross linked polyethylene cable insulation; Electrical trees; Frequency; Morphology; Residual stress

Indexed keywords

AMORPHOUS REGIONS; APPLIED VOLTAGES; CROSS-LINKED POLYETHYLENE CABLES; ELECTRICAL TREES; EXTRACTION PROCESS; FRACTAL ANALYSIS; FREQUENCY; HIGH FREQUENCY; INITIATION AND PROPAGATION; INNER LAYER; LOW FREQUENCY; LOW FREQUENCY RANGE; MICROPORES; MONITORING SYSTEM; NEEDLE ELECTRODES; NONUNIFORM; PROPAGATION CHARACTERISTICS; RELATIVE POSITIONS; SEMICRYSTALLINES; STRUCTURAL CHARACTERISTICS; STRUCTURE CHARACTERISTIC; XLPE CABLES;

CABLES; COMPUTER CRIME; DIELECTRIC MATERIALS; ELECTRIC NETWORK ANALYSIS; FRACTAL DIMENSION; IMAGE RECORDING; INSULATING MATERIALS; MONITORING; MORPHOLOGY; NEEDLES; RESIDUAL STRESSES; THERMOPLASTICS;

POLYETHYLENES;

EID: 77954204098     PISSN: 10709878     EISSN: None     Source Type: Journal    
DOI: 10.1109/TDEI.2010.5492239     Document Type: Article

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