Measurement and simulation of electrical tree growth and partial discharge activity in epoxy resin

Journal of Physics D: Applied Physics

Volumn 34, Issue 9, 2001, Pages 1389-1398

  Noskov, M D ^a   Sack, M ^b   Malinovski, A S ^a   Schwab, A J ^b  

^a NATIONAL RESEARCH TOMSK POLYTECHNIC UNIVERSITY   (Russian Federation)

^b UNIVERSITY OF KARLSRUHE   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; DIELECTRIC MATERIALS; ELECTRIC FIELD EFFECTS; ELECTRIC POTENTIAL; LIGHT EMISSION; PARTIAL DISCHARGES; RANDOM PROCESSES;

ELECTRICAL TREEING; SELF ORGANIZED CRITICALITY;

EPOXY RESINS;

EID: 0035820751     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/34/9/316     Document Type: Article

References (38)

1. Dissado L A and Fothergill J C 1992 Electrical Degradation and Breakdown in Polymers (London: Peregrinus)
2. Laurent C and Mayoux C 1980 IEEE Trans. Dielectr. Electr. Insul. 15 33-42
3. Champion J V and Dodd S J 1996 J. Phys. D: Appl. Phys. 29 862-8
4. Champion J V, Dodd S J and Alison J M 1996 J. Phys. D: Appl. Phys. 29 2689-95
5. Suwarno, Suzuoki Y, Komori F and Mizutani T 1996 J. Phys. D: Appl. Phys. 29 2922-31
6. Ehara Y, Naoe M, Urano K, Kishida H, Matsuyama M and Ito T 1998 IEEE Trans. Dielectr. Electr. Insul. 5 728-33
7. Wu K, Suzuoki Y, Mizutani T and Xie H 2000 J. Phys. D: Appl. Phys. 33 1197-201
8. Niemeyer L, Pietronero L and Wiesmann H J 1984 Phys. Rev. Lett. 52 1033-6
9. Wiesmann H J and Zeller H R 1986 J. Appl. Phys. 60 1770-3
10. Barclay A L, Sweeney P G, Dissado L A and Stevens G S 1990 J. Phys. D: Appl. Phys. 23 1536-45
11. Sweeney P J J, Dissado L A and Cooper J M 1992 J. Phys. D: Appl. Phys. 25 113-19
12. Dissado L A and Sweeney P J J 1993 Phys. Rev. B 48 16 261-8
13. Fothergill J C, Dissado L A and Sweeney P J J 1994 IEEE Trans. Dielectr. Electr. Insul. 1 474-86
14. Noskov M D, Kukhta V R and Lopatin V V 1995 J. Phys. D: Appl. Phys. 28 1187-94
15. Dissado L A, Dodd S J, Champion J V, Williams P I and Alison J M 1997 IEEE Trans. Dielectr. Electr. Insul. 4 259-79
16. Niemeyer L 1995 IEEE Trans. Dielectr. Electr. Insul. 2 510-28
17. Gutfleisch F and Niemeyer L 1995 IEEE Trans. Dielectr. Electr. Insul. 2 729-43
18. Suwarno, Suzuoki Y and Mizutani T 1996 Ann. Rep. Conf. Elect. Insul. Dielect. Phenom. pp 480-3
19. Patch R and Hoof M 1997 Proc. 5th Int. Conf. on Properties and Application of Dielectric Materials pp 283-6
20. Champion J V and Dodd S J 1998 J. Phys. D: Appl. Phys. 31 2305-14
21. Wu K, Suzuoki Y, Muzutani T and Xie H 1999 IEEE Trans. Dielectr. Electr. Insul. 6 181-90
22. Wu K, Suzuoki Y, Muzutani T and Xie H 2000 J. Phys. D: Appl. Phys. 33 1202-8
23. Wu K, Suzuoki Y, Muzutani T and Xie H 2000 J. Phys. D: Appl. Phys. 33 1209-18
24. Malinovski A S, Noskov M D, Sack M and Schwab A J 1998 Proc. 6th Int. Conf. on Conduction and Breakdown in Solid Dielectrics pp 305-8
25. Noskov M D, Malinovski A S, Sack M and Schwab A J 1999 Proc. 11th ISH vol 2, pp 2.136-9
26. Noskov M D, Malinovski A S, Sack M and Schwab A J 1999 Ann. Rep. CEIDP 1999 vol 2, pp 597-600
27. Noskov M D, Malinovski A S, Sack M and Schwab A J 2001 Physica A submitted
28. Bak P, Tang C and Wiesenfeld K 1987 Phys. Rev. Lett. 59 381-4
29. Bak P, Tang C and Wiesenfeld K 1988 Phys. Rev. A 38 364-74
30. Zeller H R and Schneider W R 1984 J. Appl. Phys. 56 455-9
31. Fothergill J C 1991 IEEE Trans. Dielectr. Electr. Insul. 26 1124-9
32. Varlow B R and Auckland D W 1996 IEEE Electr. Insul. Mag. 12 21-6
33. Bamji S, Bulinski A T, Chen Y and Densley R 1991 ICPADM-91 pp 51-4
34. Singer H, Steinbigler H and Weiss P 1974 IEEE Trans. Power Apparatus Syst. 93 1660-8
35. Kudo K 1998 IEEE Trans. Dielectr. Electr. Insul. 5 713-27
36. Uehara H and Kudo K 1998 Proc. 6th Int. Conf. on Conduction and Breakdown in Solid Dielectrics. pp 309-12
37. Champion J V, Dodd S J and Stevens G C 1994 J. Phys. D: Appl. Phys. 27 1020-30
38. Champion J V and Dodd S J 1995 J. Phys. D: Appl. Phys. 28 398-407