A binary programming approach to automated test assembly for cognitive diagnosis models

Applied Psychological Measurement

Volumn 34, Issue 5, 2010, Pages 310-326

  Finkelman, Matthew D ^a   Kim, Wonsuk ^b   Roussos, Louis ^b   Verschoor, Angela ^c  

^a TUFTS UNIVERSITY SCHOOL OF DENTAL MEDICINE   (United States)

^b Measured Progress   (United Kingdom)

^c Cito group   (Netherlands)

Author keywords

Automated test assembly; Binary programming; Cognitive diagnosis models; Test construction

Indexed keywords

EID: 77954197822     PISSN: 01466216     EISSN: 15523497     Source Type: Journal    
DOI: 10.1177/0146621609344846     Document Type: Article

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