Characteristics of evanescent polarization imaging

Journal of Modern Optics

Volumn 57, Issue 9, 2010, Pages 783-797

  Yang, Seung Hune ^a   Milster, Tom ^a   Zhang, Jun ^a   Chen, Tao ^a  

^a UNIVERSITY OF ARIZONA   (United States)

Author keywords

native polarization and induced polarization; near field images; solid immersion lens

Indexed keywords

AIR-GAPS; ALTERNATING PHASE SHIFT MASKS; ATOMIC FORCE MICROSCOPES; CHROME-ON-GLASS; DIELECTRIC GRATING; EVANESCENT ENERGY; EXPERIMENTAL MEASUREMENTS; INDUCED POLARIZATION; MATERIAL STRUCTURE; NEAR-FIELD IMAGES; OBJECT STRUCTURE; POLARIZATION ANGLE; POLARIZATION IMAGING; SOLID IMMERSION LENS; SPATIAL FREQUENCY; TOPOGRAPHICAL IMAGES; TOPOGRAPHICAL STRUCTURE;

CRYSTAL ATOMIC STRUCTURE; LENSES; MICROSCOPES; MULTILAYERS; OPTICAL INSTRUMENTS; OPTICAL MICROSCOPY; PHOTOMASKS; POLARIZATION;

OPTICAL DATA STORAGE;

EID: 77954053966     PISSN: 09500340     EISSN: 13623044     Source Type: Journal    
DOI: 10.1080/09500341003660531     Document Type: Article

References (15)

1. Chen, T.; Milster, T.D.; Yang, S.-H.; Hansen, D. Opt. Lett. 2007, 32, 124-126.
2. Mechau, 1934, see Dreyhaupt, W. Werkstattstechnik Werksleiter 1939, 33, 321.
3. Guerra, J.M. Appl. Opt. 1990, 29, 3741-3752.
4. Wikipedia. http://en.wikipedia.org/wiki/Total-internal-reflection- fluorescence-microscope
5. Kino, 5.G.S.; Mansfield, S.M. Solid Immersion Lens Photon Tunneling Microscope (Invited Paper). In Society of Photo-Optical Instrumentation Engineers (SPIE) Conference; Kino, G.S., Ed.; Society of Photo-Optical Instrumentation Engineers (SPIE) Conference Series, Vol. 1556; SPIE Press: Bellingham, WA, 1992.
6. Chen, T.; Milster, T.D.; Yang, S.-H. Experimental Investigation of Photomask with Near-field Polarization Imaging. In Society of Photo-Optical Instrumentation Engineers (SPIE) Conference; Society of Photo-Optical Instrumentation Engineers (SPIE) Conference Series, Vol. 6349; SPIE Press: Bellingham, WA, 2006. (Pubitemid 44300543)
7. Chen, T.; Milster, T.D.; Park, S.; McCarthy, B.; Sarid, D. Opt. Eng. 2006, 45, 103002.
8. Lang, M.; Aspnes, E.; Milster, T.D. Opt. Express 2008, 16, 20008-20028.
9. Yang, S.; Zhang, J.; Milster, T.; Park, J.R. Appl. Opt., to be submitted for publication.
10. Totzeck, M. Optik 2001, 112, 399-406.
11. Saito, K.; Ishimoto, T.; Kondo, T.; Nakaoki, A.; Masuhara, S.; Furuki, M.; Yamamoto, M. Jpn J. Appl. Phys. 2002, 41, 1898-1902.
12. Yang, S.; Milster, T.; Park, J.R. J. Opt. Soc. Am. A, submitted for publication.
13. Moharam, M.G.; Grann, E.B.; Pommet, D.A.; Gaylor, T.K. J. Opt. Soc. Am. A 1995, 12, 1068-1076.
14. Zhang, J.; Lang, M.; Milster, T.D.; Chen, T.; Aspnes, E.; Bell, B. Fabrication and Testing of a GaP SIL with NA=2.64. In Society of Photo-Optical Instrumentation Engineers (SPIE) Conference; Society of Photo-Optical Instrumentation Engineers (SPIE) Conference Series, Vol. 6620; SPIE Press: Bellingham, WA, 1995.
15. Shinoda, M.; Kino, G.S.; Mansfield, S.M. Jpn J. Appl. Phys. 2006, 45, 1311-1313.