Near-field induced polarization imaging for optical data storage metrology

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 6282, Issue , 2006, Pages

  Chen, Tao ^a   Muster, Tom D ^a  

^a UNIVERSITY OF ARIZONA   (United States)

Author keywords

High resolution; Near field; Solid immersion lens (SIL); Topographical image

Indexed keywords

CALIBRATION; INFORMATION RETRIEVAL; LIGHT POLARIZATION; OPTICAL DATA STORAGE; OPTICAL RESOLVING POWER; VIDEODISKS;

HIGH RESOLUTION; NEAR-FIELD; SOLID IMMERSION LENS (SIL); TOPOGRAPHICAL IMAGE;

IMAGING TECHNIQUES;

EID: 33748043657     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.685172     Document Type: Conference Paper

References (8)

1. T. Milster, Optics and Photonics News, March, 28-33, (2005).
2. M. Shinoda, K. Saito, T. Ishimoto, etc, ISOM/ODS 05 Technical Digest, WD1 (2005).
3. S. M. Mansfield, G.S.Kino, Appl. Phys. Lett. 57, 2615, (1990).
4. T. Ishimoto, K. Saito, M. Shinoda, T. Kondo, A. Nakaoki and M. Yamamoto, Jpn. J. Appl. Phys. 42, 2719 (2003).
5. J.S. Jo,T.D. Muster and J.K. Erwin, Opt.-Eng. 41,1866 (2002).
6. T.D. Milster, J. S. Jo and K. Hirota, Appl. Opt. 38, 5046 (1999).
7. T.R. Corle, L.C. Mantalas, T.R. Kaack, and L.J. Lacomb, Appl. Opt. 33, 670 (1994).
8. T. Chen, T.D. Milster, J.K. Park, B. McCarthy, D. Sarid, C. Poweleit and J. Menendez, Accepted for publication to Opt. Eng.2006