Evanescent imaging with induced polarization by using a solid immersion lens

Optics Letters

Volumn 32, Issue 2, 2007, Pages 124-126

  Chen, Tao ^a   Milster, Tom D ^a   Yang, Seung Hune ^a   Hansen, Delbert ^a  

^a UNIVERSITY OF ARIZONA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EVANESCENT IMAGING; HEIGHT INFORMATION; IMAGE CONTRAST ENHANCEMENT; TOPOGRAPHICAL IMAGE;

IMAGE ENHANCEMENT; LIGHT POLARIZATION; NATURAL FREQUENCIES; NUMERICAL ANALYSIS; SILICON;

IMAGING TECHNIQUES;

EID: 33846859945     PISSN: 01469592     EISSN: None     Source Type: Journal    
DOI: 10.1364/OL.32.000124     Document Type: Article

References (11)

1. S. M. Mansfield and G. S. Kino, Appl. Phys. Lett. 57, 2615 (1990).
2. Z. H. Liu, B. B. Goldberg, S. B. Ippolito, A. N. Vamivakas, M. S. Unlu, and R. Mirin, Appl. Phys. Lett. 87, 071905 (2005).
3. For example, the WYKO NT2000 Optical Profiler, produced by Veeco Metrology Group, Tucson, Arizona.
4. T. Ishimoto, K. Saito, M. Shinoda, T. Kondo, A. Nakaoki, and M. Yamamoto, Jpn. J. Appl. Phys., Part 1 42, 2719 (2003).
5. B. Richards and E. Wolf, Proc. R. Soc. London, Ser. A 253, 358 (1959).
6. D. G. Flagello, T. Milster, and A. E. Rosenbluthk, J. Opt. Soc. Am. A 13, 53 (1996).
7. T. D. Muster, J. S. Jo, and K. Hirota, Appl. Opt. 38, 5046 (1999).
8. H. A. Macleod, Thin Film Optical Filters (McGraw-Hill, 1989).
9. T. Chen, T. D. Milster, S. K. Park, B. McCarthy, D. Sarid, C. Poweleit, and J. Menendez, Opt. Eng. 45, 103002 (2002).
10. E. H. K. Stelzer, J. Microsc. 189, 15 (1998).
11. T. R. Corle, L. C. Mantalas, T. R. Kaack, and L. J. Lacomb, Appl. Opt. 33, 670 (1994).