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Volumn 81, Issue 1, 2010, Pages

Spin-wave transduction at the submicrometer scale: Experiment and modeling

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Indexed keywords


EID: 77953854706     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.81.014425     Document Type: Article
Times cited : (205)

References (45)
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    • Note that the results of such calculations for the self-inductance of much wider antennae and for magnetostatic surface waves had been reported in Refs..
    • Note that the results of such calculations for the self-inductance of much wider antennae and for magnetostatic surface waves had been reported in Refs..
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    • Lequ (k,ω ) has the dimension of a linear inductance. k Lequ (k,ω ) can be interpreted as the self-inductance per unit surface for a perfectly monochromatic antenna (infinitely extended harmonic distribution of current)
    • L e q u (k, ω) has the dimension of a linear inductance. k L e q u (k, ω) can be interpreted as the self-inductance per unit surface for a perfectly monochromatic antenna (infinitely extended harmonic distribution of current).
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    • Note that the magnetic film thickness t was given different values for the four devices, ranging from 17 to 19 nm. This parameter is critical in setting the spacing between the main and secondary absorption peaks, which does not depend strongly on the value of the other parameters. We attribute the different values to a slight and inhomogeneous degradation of the film during the fabrication process. These differences were also obtained when following precisely the position of the main and secondary self-inductance absorption peaks as a function of the external field (Ref.)
    • Note that the magnetic film thickness t was given different values for the four devices, ranging from 17 to 19 nm. This parameter is critical in setting the spacing between the main and secondary absorption peaks, which does not depend strongly on the value of the other parameters. We attribute the different values to a slight and inhomogeneous degradation of the film during the fabrication process. These differences were also obtained when following precisely the position of the main and secondary self-inductance absorption peaks as a function of the external field (Ref.).


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