Vector network analyzer ferromagnetic resonance of thin films on coplanar waveguides: Comparison of different evaluation methods

Journal of Applied Physics

Volumn 101, Issue 7, 2007, Pages

  Bilzer, C ^a   Devolder, T ^a   Crozat, P ^a   Chappert, C ^a   Cardoso, S ^b   Freitas, P P ^b  

^a UNIVERSITÉ PARIS SACLAY   (France)

^b INSTITUTO SUPERIOR TÉCNICO   (Portugal)

Author keywords

[No Author keywords available]

Indexed keywords

COPLANAR WAVEGUIDES; ELECTRIC NETWORK ANALYZERS; FERROMAGNETIC MATERIALS; FERROMAGNETIC RESONANCE; MAGNETIC SUSCEPTIBILITY; PERMITTIVITY; SCATTERING PARAMETERS;

FERROMAGNETIC RESONANCE FREQUENCIES; RESONANCE LINEWIDTHS;

THIN FILMS;

EID: 34247262650     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2716995     Document Type: Article

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