메뉴 건너뛰기




Volumn , Issue , 2010, Pages

Interconnection technologies for photovoltaic modules - Analysis of technological and mechanical problems

Author keywords

[No Author keywords available]

Indexed keywords

ASSEMBLY PROCESS; HIGH CURRENTS; HIGH-POWER; INTERCONNECTION TECHNOLOGY; LOW VOLTAGES; MECHANICAL PROBLEMS; MECHANICAL STRESS; MODULE EFFICIENCY; PHOTOVOLTAIC MODULES;

EID: 77953713791     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ESIME.2010.5464518     Document Type: Conference Paper
Times cited : (17)

References (4)
  • 3
    • 45949093528 scopus 로고    scopus 로고
    • The effect of downscaling the dimensions of solder interconnects on their creep properties
    • Wiese, S. et al, "The effect of downscaling the dimensions of solder interconnects on their creep properties" Microelectronics Reliability, Vol. 48 (2008), pp. 843-850
    • (2008) Microelectronics Reliability , vol.48 , pp. 843-850
    • Wiese, S.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.