Visual indicator for trace organic volatiles

Langmuir

Volumn 26, Issue 6, 2010, Pages 3767-3770

  Rakow, Neal A ^a   Wendland, Michael S ^a   Trend, John E ^a   Poirier, Richard J ^a   Paoluccia, Dora M ^a   Maki, Stephen P ^a   Lyons, Christopher S ^a   Swierczek, Mary J ^a  

^a 3M COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRITICAL ATTRIBUTES; OPTOELECTRONIC DETECTION; ORGANIC VAPORS; ORGANIC VOLATILES; PARTS PER BILLION; PARTS PER MILLIONS; THIN FILM TRANSDUCERS; VISUAL INDICATORS;

MICROPOROSITY; MICROPOROUS MATERIALS; VOLATILE ORGANIC COMPOUNDS; WATER VAPOR;

SENSORS;

EID: 77953665002     PISSN: 07437463     EISSN: 15205827     Source Type: Journal    
DOI: 10.1021/la903483q     Document Type: Article

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30. The standard deviation for repeated peak wavelength measurements using the USB2000 spectrometer was observed to be 0.35 nm, with a quoted wavelength resolution of 0.30 nm for the device. At the 3σ level, detection limits are determined to be 14 ppb for styrene and 32 ppb for toluene based on slopes determined from the three lowest concentration points in each curve. Our current test methods do not permit delivery of levels below 50 ppb for conducting performance tests.