-
1
-
-
47249085994
-
Carbon/high-k trench capacitor for the 40 nm DRAM generation
-
G. Aichmayr, G. S. Duesberg, F. Kreupl, S. Kudelka, M. Liebau, A. Saenger, J. Schumann, and O. Storbeck, " Carbon/high-k trench capacitor for the 40 nm DRAM generation.," Proceedings of IEEE Symposium on VLSI Technology, 2007, pp. 186-187.
-
(2007)
Proceedings of IEEE Symposium on VLSI Technology
, pp. 186-187
-
-
Aichmayr, G.1
Duesberg, G.S.2
Kreupl, F.3
Kudelka, S.4
Liebau, M.5
Saenger, A.6
Schumann, J.7
Storbeck, O.8
-
2
-
-
64549103733
-
Carbon-based resistive memory
-
Technical Digest
-
F. Kreupl, R. Bruchhaus, P. Majewski, J. B. Philipp, R. Symanczyk, T. Happ, C. Arndt, M. Vogt, R. Zimmermann, A. Buerke, A. P. Graham, and M. Kund, " Carbon-based resistive memory.," Proceedings of International Electron Devices Meeting (IEDM), 2008, Technical Digest, pp. 521-524.
-
(2008)
Proceedings of International Electron Devices Meeting (IEDM)
, pp. 521-524
-
-
Kreupl, F.1
Bruchhaus, R.2
Majewski, P.3
Philipp, J.B.4
Symanczyk, R.5
Happ, T.6
Arndt, C.7
Vogt, M.8
Zimmermann, R.9
Buerke, A.10
Graham, A.P.11
Kund, M.12
-
3
-
-
0027149108
-
-
JAPNDE 0021-4922. 10.1143/JJAP.32.380
-
G. Raghavan, J. L. Hoyt, and J. F. Gibbons, Jpn. J. Appl. Phys., Part 1 JAPNDE 0021-4922 32, 380 (1993). 10.1143/JJAP.32.380
-
(1993)
Jpn. J. Appl. Phys., Part 1
, vol.32
, pp. 380
-
-
Raghavan, G.1
Hoyt, J.L.2
Gibbons, J.F.3
-
4
-
-
0001011982
-
-
CRBNAH 0008-6223. 10.1016/S0008-6223(97)00155-3
-
A. Becker and K. J. Hüttinger, Carbon CRBNAH 0008-6223 36, 117 (1998). 10.1016/S0008-6223(97)00155-3
-
(1998)
Carbon
, vol.36
, pp. 117
-
-
Becker, A.1
Hüttinger, K.J.2
-
5
-
-
9944249338
-
-
(Springer, New York)
-
E. R. Cohen, D. R. Lide, and G. L. Trigg, AIP Physics Desk Reference, (Springer, New York, 2003), p. 396.
-
(2003)
AIP Physics Desk Reference
, pp. 396
-
-
Cohen, E.R.1
Lide, D.R.2
Trigg, G.L.3
-
6
-
-
0035276168
-
Photoemission spectroscopy of single-walled carbon nanotube bundles
-
DOI 10.1016/S0368-2048(00)00294-2
-
S. Suzuki, C. Bower, T. Kiyokura, K. G. Nath, Y. Watanabe, and O. Zhou, J. Electron Spectrosc. Relat. Phenom. JESRAW 0368-2048 114-116, 225 (2001). 10.1016/S0368-2048(00)00294-2 (Pubitemid 32263892)
-
(2001)
Journal of Electron Spectroscopy and Related Phenomena
, vol.114-116
, pp. 225-228
-
-
Suzuki, S.1
Bower, C.2
Kiyokura, T.3
Nath, K.G.4
Watanabe, Y.5
Zhou, O.6
-
7
-
-
77953624820
-
-
Finite element simulations performed using FEMLAB software from COMSOL Multiphysics GmbH
-
Finite element simulations performed using FEMLAB software from COMSOL Multiphysics GmbH.
-
-
-
-
8
-
-
19944432253
-
Comprehensive study of the resistivity of copper wires with lateral dimensions of 100 nm and smaller
-
DOI 10.1063/1.1834982, 023706
-
W. Steinhögl, G. Schindler, G. Steinlesberger, M. Traving, and M. Engelhardt, J. Appl. Phys. JAPIAU 0021-8979 97, 023706 (2005). 10.1063/1.1834982 (Pubitemid 40183040)
-
(2005)
Journal of Applied Physics
, vol.97
, Issue.2
, pp. 0237061-0237067
-
-
Steinhogl, W.1
Schindler, G.2
Steinlesberger, G.3
Traving, M.4
Engelhardt, M.5
-
9
-
-
0004173989
-
-
(Noyes Publications, New Jersey)
-
H. O. Pierson, Handbook of Carbon, Graphite, Diamond, and Fullerenes (Noyes Publications, New Jersey, 1993), p. 160.
-
(1993)
Handbook of Carbon, Graphite, Diamond, and Fullerenes
, pp. 160
-
-
Pierson, H.O.1
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