Microstructural, magnetic and microwave properties of large area BaFe 12O19 thick films (>100 μm) deposited on /a-SiO 2/Si and /a-Al2O3/Si substrates

IEEE Transactions on Magnetics

Volumn 44, Issue 12, 2008, Pages 4571-4577

  Chen, Yajie ^a   Smith, Ian C ^a   Geiler, Anton L ^a   Vittoria, Carmine ^a   Zagorodnii, Volodymyr ^b   Celinski, Zbigniew ^b   Harris, Vincent G ^a  

^a Northeastern University   (United States)

^b UNIVERSITY OF COLORADO   (United States)

Author keywords

Hexaferrite; Microwave; Screen printing; Silicon

Indexed keywords

CERAMIC FILM; DEPTH ANALYSIS; ENERGY DISPERSIVE X RAY SPECTROSCOPY; FERRITE FILMS; HEXAFERRITE; HEXAFERRITES; MAGNETIC AND MECHANICAL PROPERTIES; MICRO-STRUCTURAL; MICROWAVE PROPERTY; POLYCRYSTALLINE SAMPLES; SCREEN PRINTING TECHNIQUE; SI SUBSTRATES; SILICON (100); SILICON DIFFUSION; X RAY DIFFRACTOMETRY;

ALUMINUM; AMORPHOUS FILMS; BUFFER LAYERS; EPITAXIAL LAYERS; FERRITE; FERROMAGNETIC RESONANCE; MAGNETIC MATERIALS; MECHANICAL PROPERTIES; MICROWAVES; OPTICAL WAVEGUIDES; PRINTING PRESSES; SCANNING ELECTRON MICROSCOPY; SCREEN PRINTING; SILICON COMPOUNDS; SILICON OXIDES; THICK FILMS; X RAY DIFFRACTION ANALYSIS; X RAY SPECTROSCOPY;

AMORPHOUS SILICON;

EID: 77953623885     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMAG.2008.2002573     Document Type: Article

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