Oriented barium hexaferrite thick films with narrow ferromagnetic resonance linewidth

Applied Physics Letters

Volumn 88, Issue 6, 2006, Pages

  Chen, Yajie ^a   Sakai, Tomokazu ^a   Chen, Taiyang ^a   Yoon, Soack D ^a   Geiler, Anton L ^a   Vittoria, Carmine ^a   Harris, Vincent G ^a  

^a Northeastern University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BARIUM HEXAFERRITE THICK FILMS; POLYCRYSTALLINE FERRITE; SELF-BIASING MICROWAVE DEVICES;

BARIUM COMPOUNDS; FERRITE; MAGNETIC VARIABLES MEASUREMENT; MICROWAVE MEASUREMENT; POLYCRYSTALLINE MATERIALS; POROSITY;

THICK FILMS;

EID: 32444432496     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2173240     Document Type: Article

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