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Volumn 26, Issue 2, 2010, Pages 7-13

Overview of laminar dielectric capacitors

Author keywords

Capacitor; Film dielectric; Laminar dielectric; Paper

Indexed keywords

CAPACITOR FILMS; DIELECTRIC CAPACITORS; DIELECTRIC PAPER; FILTER CAPACITORS; HIGH VOLTAGE; HIGH VOLTAGE CAPACITORS; HIGH-VOLTAGE DESIGN; IMPREGNATED PAPER; LOW INDUCTANCE; LOW LOSS; LOW VOLTAGES; METALIZED FILMS; PARALLEL PLATE CAPACITORS; PULSED-POWER; UTILITY POWER;

EID: 77953593315     PISSN: 08837554     EISSN: None     Source Type: Journal    
DOI: 10.1109/MEI.2010.5482550     Document Type: Review
Times cited : (34)

References (7)
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  • 2
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    • Pulse power capability of high energy density capacitors based on a new dielectric material
    • K. M. Slenes, P. Winsor, T. Scholz, and M. Hudis, "Pulse power capability of high energy density capacitors based on a new dielectric material," IEEE Trans. Mag., vol.37, no.1, pp. 324-327, 2001.
    • (2001) IEEE Trans. Mag. , vol.37 , Issue.1 , pp. 324-327
    • Slenes, K.M.1    Winsor, P.2    Scholz, T.3    Hudis, M.4
  • 3
    • 0028531770 scopus 로고
    • The fundamental of aging in HV polymer-film capacitors
    • C. W. Reed and S. W. Cichanowski, "The fundamental of aging in HV polymer-film capacitors," IEEE Trans. Dielectr. Electr. Insul., vol.1, no.5, pp. 904-922, 1994.
    • (1994) IEEE Trans. Dielectr. Electr. Insul. , vol.1 , Issue.5 , pp. 904-922
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  • 4
    • 0142057575 scopus 로고    scopus 로고
    • Electrothermal failure of metallized film capacitor end connections-Computation of temperature rise at connection spots
    • X. Qi and S. A. Boggs, "Electrothermal failure of metallized film capacitor end connections-Computation of temperature rise at connection spots," J. App. Phys., vol.94, no.7, pp. 4449-4456, 2003.
    • (2003) J. App. Phys. , vol.94 , Issue.7 , pp. 4449-4456
    • Qi, X.1    Boggs, S.A.2
  • 5
    • 58149116462 scopus 로고    scopus 로고
    • Implications of advanced capacitor dielectrics for performance of metalized film windings
    • Dec.
    • J. Ho, R. Jow, and S. A. Boggs, "Implications of advanced capacitor dielectrics for performance of metalized film windings," IEEE Trans. Dielectr. Electr. Insul., vol.15, no.6, pp. 1754-1760, Dec. 2008.
    • (2008) IEEE Trans. Dielectr. Electr. Insul. , vol.15 , Issue.6 , pp. 1754-1760
    • Ho, J.1    Jow, R.2    Boggs, S.A.3
  • 6
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    • Automatic breakdown voltage measurement of polymer films
    • Nov./Dec.
    • C. Xu, J. Ho, and S. A. Boggs, "Automatic breakdown voltage measurement of polymer films," IEEE Electr. Insul. Mag., vol.24, no.6, pp. 30-44, Nov./Dec. 2008.
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  • 7
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    • Limits to the performance and design of high voltage metalized film capacitors
    • Submitted to, Nov.
    • S. C. Qin and S. A. Boggs, "Limits to the performance and design of high voltage metalized film capacitors," Submitted to IEEE Trans. Dielectr. Electr. Insul., Nov. 2009.
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.