Automatic breakdown voltage measurement of polymer films

IEEE Electrical Insulation Magazine

Volumn 24, Issue 6, 2008, Pages 30-34

  Xu, Chunchuan ^a   Ho, Janet ^a   Boggs, Steven A ^a  

^a UNIVERSITY OF CONNECTICUT   (United States)

Author keywords

Breakdown strength; Measurement methods; Polymer films; Weibull distribution

Indexed keywords

DIELECTRIC FILMS; ELECTRIC BREAKDOWN; ELECTRIC CONDUCTIVITY; ELECTRODES; INTERFACES (COMPUTER); IONIZATION OF GASES; METALLIZING; PHOTORESISTS; PLASTIC FILMS; POLYMERS; PROBABILITY; PROBABILITY DISTRIBUTIONS; RANDOM PROCESSES; WEIBULL DISTRIBUTION;

ACTIVE AREAS; AREA-BASED; AUTOMATIC SYSTEMS; BREAKDOWN PROBABILITIES; BREAKDOWN STRENGTH; CONFIDENCE LIMITS; GOOD DATUMS; INSULATION DESIGNS; LAB VIEWS; LOW PROBABILITIES; MEASUREMENT METHODS; MECHANICAL ASSEMBLIES; METAL ELECTRODES; METALIZED FILMS; SAMPLE SURFACES; STATISTICAL DISTRIBUTIONS; SYSTEM INSULATIONS; WEIBULL;

POLYMER FILMS;

EID: 57849163208     PISSN: 08837554     EISSN: None     Source Type: Journal    
DOI: 10.1109/MEI.2008.4665348     Document Type: Article

References (5)

1. S. J. Laihonen, U. Gafvert, T. Schutte, and U. W. Gedde, "The influence of electrode area on dielectric breakdown strength of thin poly(ethyleneterephthalate) films," in Proc. IEEE Conf. on Electr. Insul. Dielectric Phenomena, Boulder, CO, 2004, pp. 563-567.
2. W. Hauschild and W. Moss, Statistic Techniques for High Voltage Engineering, London: Peter Pergrinus Ltd, ch. 6, 1992
3. W. Weibull, "A statistical distribution function of wide applicability," J. Appl. Mech., Vol. 18, pp. 293-297, 1951.
4. R. Ross, "Bias and standard deviation due to Weibull parameters estimation for small data sets," IEEE Trans. Electr. Insul., vol. 3, no. 1, pp. 28-42, 1996.
5. L. A. Dissado and J. C. Fothergill, Electrical Degradation and Breakdown in Polymers. London, UK: Peter Pergrinus Ltd., 1992.