Structural and optical characterization of Ag photo-doped thin As 40S60-xSex films for non-linear applications

Journal of Optics

Volumn 12, Issue 6, 2010, Pages

  Tasseva, J ^a   Todorov, R ^a   Babeva, Tz ^a   Petkov, K ^a  

^a CENTRAL LABORATORY OF PHOTOPROCESSES   (Bulgaria)

Author keywords

Chalcogenide thin films; Non linear refractive index; Optical properties; Raman spectroscopy; Silver diffusion

Indexed keywords

ARSENIC COMPOUNDS; ENERGY GAP; FUSED SILICA; OPTICAL PROPERTIES; RAMAN SPECTROSCOPY; REFRACTIVE INDEX; SELENIUM COMPOUNDS; SEMICONDUCTOR DOPING; SILVER; SILVER METALLOGRAPHY; THIN FILMS; TWO PHOTON PROCESSES;

CHALCOGENIDE THIN FILMS; INTERFEROMETRIC PROFILER; NON LINEAR; SILVER DIFFUSION; STRUCTURAL AND OPTICAL CHARACTERIZATIONS; TELECOMMUNICATION WAVELENGTHS; TRANSMITTANCE AND REFLECTANCES; TWO PHOTON ABSORPTION;

SULFUR COMPOUNDS;

EID: 77953566238     PISSN: 20408978     EISSN: 20408986     Source Type: Journal    
DOI: 10.1088/2040-8978/12/6/065601     Document Type: Article

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