Optical characterization of Ag/As-S-Se thin films

Journal of Optoelectronics and Advanced Materials

Volumn 9, Issue 10, 2007, Pages 3119-3124

  Tasseva, J ^a   Lozanova, V ^a   Todorov, R ^a   Petkov, K ^a  

^a CENTRAL LABORATORY OF PHOTOPROCESSES   (Bulgaria)

Author keywords

Chalcogenide glasses; Optical properties; Thin films

Indexed keywords

ENERGY GAP; OPTICAL FILMS; OPTICAL GLASS; OPTICAL PROPERTIES; REFRACTIVE INDEX; SELENIUM; SILVER; SUBSTRATES; THERMAL EVAPORATION; THIN FILMS;

CHALCOGENIDE GLASS; DIFFERENT THICKNESS; DISPERSION ENERGIES; EFFECTIVE COORDINATION NUMBERS; OPTICAL CHARACTERIZATION; PHOTOINDUCED STRUCTURAL CHANGES; REFRACTIVE INDEX INCREASE; SURFACE MICROSTRUCTURES;

SULFUR COMPOUNDS;

EID: 38549120957     PISSN: 14544164     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Conference Paper

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