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1
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65849167842
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Newly developed postive tone resists for Posi/Posi double patterning process
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T. Nakamura, M. Takeshita, S. Maemori, R. Uchida, R. Takasu, K. Ohmori, "Newly developed postive tone resists for Posi/Posi double patterning process", SPIE 7273-03 (2009).
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(2009)
SPIE
, vol.7273
, Issue.3
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Nakamura, T.1
Takeshita, M.2
Maemori, S.3
Uchida, R.4
Takasu, R.5
Ohmori, K.6
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2
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65849416098
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Double-exposure materials for pitch division with 193nm lithography: Requirements, results
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R. Bristol, D. Shykind, S. Kim, Y. Borodovsky, E. Schwartz, C. Turner, G. Masson, K. Min, K. Esswein, J. M. Blackwell, and N. Suetin, "Double-exposure materials for pitch division with 193nm lithography: requirements, results ," Proceedings of the SPIE - The International Society for Optical Engineering, vol. 7273, 2009.
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(2009)
Proceedings of the SPIE - The International Society for Optical Engineering
, vol.7273
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Bristol, R.1
Shykind, D.2
Kim, S.3
Borodovsky, Y.4
Schwartz, E.5
Turner, C.6
Masson, G.7
Min, K.8
Esswein, K.9
Blackwell, J.M.10
Suetin, N.11
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3
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58149350260
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Double-patterning requirements for optical lithography and prospects for optical extension without double patterning
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A. Andrew J. Hazelton, Shinji Wakamoto, Shigeru Hirukawa, Martin McCallum, Nobutaka Magome, Jun Ishikawa, Céline Lapeyre, Isabelle Guilmeau, Sébastien Barnola, and Stéphanie Gaugiran, "Double-patterning requirements for optical lithography and prospects for optical extension without double patterning", J. Micro/Nanolith. MEMS MOEMS 8, 011003 (2009)
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(2009)
J. Micro/Nanolith. MEMS MOEMS
, vol.8
, pp. 011003
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Andrew, A.1
Hazelton, J.2
Wakamoto, S.3
Hirukawa, S.4
McCallum, M.5
Magome, N.6
Ishikawa, J.7
Lapeyre, C.8
Guilmeau, I.9
Barnola, S.10
Gaugiran, S.11
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4
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45449092368
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An analysis of double exposure lithography options
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Lee, S., Byers, J., Jen, K., Zimmerman, P., Rice, B.J., Turro, N.J., Willson, C.G., "An analysis of double exposure lithography options," Proc. SPIE V 6924, 69242A-4 (2008).
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(2008)
Proc. SPIE V
, vol.6924
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Lee, S.1
Byers, J.2
Jen, K.3
Zimmerman, P.4
Rice, B.J.5
Turro, N.J.6
Willson, C.G.7
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5
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3843130602
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Immersion microlithography at 193 nm with a Talbot prism interferometer
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A. Bourov, Y. Fan, Frank C. Cropanese, N. Lafferty, L. Zavyalova, B. W. Smith, "Immersion microlithography at 193 nm with a Talbot prism interferometer," Proc. SPIE 5377 (2004)
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Proc. SPIE
, vol.5377
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Bourov, A.1
Fan, Y.2
Cropanese, F.C.3
Lafferty, N.4
Zavyalova, L.5
Smith, B.W.6
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6
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25144461537
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Amphibian XIS: An Immersion Lithography Microstepper Platform
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B. Smith, A. Bourov, Y. Fan, F. Cropanese, P. Hammond, "Amphibian XIS: An Immersion Lithography Microstepper Platform," Proc. SPIE 5754 (2005).
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(2005)
Proc. SPIE
, vol.5754
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Smith, B.1
Bourov, A.2
Fan, Y.3
Cropanese, F.4
Hammond, P.5
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7
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65849270494
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Naphtali A. O'Connor, Adam J. Berro, Jeffrey R. Lancaster, Xinyu Gu, Steffen Jockusch, Tomoki Nagai, Toshiyuki Ogata, Saul Lee, Paul Zimmerman, C. Grant Willson and Nicholas J. Turro, Chem. Matr., 20 pp7365-7524, (2008).
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(2008)
Chem. Matr.
, vol.20
, pp. 7365-7524
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O'Connor, N.A.1
Berro, A.J.2
Lancaster, J.R.3
Gu, X.4
Jockusch, S.5
Nagai, T.6
Ogata, T.7
Lee, S.8
Zimmerman, P.9
Willson, C.G.10
Turro, N.J.11
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8
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77953494389
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Synthesis and Photochemistry Study of Anthracenyl Photoswitches for 193-nm Double-Exposure Lithography Applications
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to be published
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K. Min, K. Esswein, G. Masson, J. Blackwell, R. Bristol, J. Roberts, D. Shykind, E. Jackson, S. Garrat, A. Sundaresan, N. Turro, P. Billone, J. C. Scaiano, S. P. George, J. S. Figueroa, P. Zimmerman, "Synthesis and Photochemistry Study of Anthracenyl Photoswitches for 193-nm Double-Exposure Lithography Applications," to be published Proceedings of the SPIE - The International Society for Optical Engineering, 2010.
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Proceedings of the SPIE - The International Society for Optical Engineering, 2010
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Min, K.1
Esswein, K.2
Masson, G.3
Blackwell, J.4
Bristol, R.5
Roberts, J.6
Shykind, D.7
Jackson, E.8
Garrat, S.9
Sundaresan, A.10
Turro, N.11
Billone, P.12
Scaiano, J.C.13
George, S.P.14
Figueroa, J.S.15
Zimmerman, P.16
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9
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77953481414
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Reaction Kinetics of Non-reciprocal Photo-Base Generator (NRPBG) Patterning
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to be published
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D. Shykind, R. Bristol, J. Roberts, J. Blackwell, and Y. Borodovsky, "Reaction Kinetics of Non-reciprocal Photo-Base Generator (NRPBG) Patterning," to be published Proceedings of the SPIE - The International Society for Optical Engineering, 2010.
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Proceedings of the SPIE - The International Society for Optical Engineering, 2010
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Shykind, D.1
Bristol, R.2
Roberts, J.3
Blackwell, J.4
Borodovsky, Y.5
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